{"title":"Reconfigurable 2.5 GHz phase-locked loop for system on chip applications","authors":"K. Iniewski, M. Syrzycki, S. Magierowski","doi":"10.1109/IWSOC.2004.55","DOIUrl":"https://doi.org/10.1109/IWSOC.2004.55","url":null,"abstract":"2.5 GHz phase-locked loop (PLL) suitable for system-on-the-chip (SOC) implementation is presented. PLL can be configured as a clock multiplication unit (CMU) or as a clock recovery unit (CRU) for data muxing or jitter clean-up applications. It uses a phase-frequency detector (PFD), a low voltage charge-pump, and a low power H-bridge output driver. Phase locked-loop architecture is of Type IV that results in superior performance for power supply rejection ratio (PSRR). The circuit has been implemented in 0.18 /spl mu/m standard CMOS process, occupies 1230 /spl mu/m by 248 /spl mu/m and dissipates 128 mW from a 1.8V power supply.","PeriodicalId":306688,"journal":{"name":"4th IEEE International Workshop on System-on-Chip for Real-Time Applications","volume":"2 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2004-07-19","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126806657","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"An embedded tester core for system-on-chip architectures","authors":"R. Rashidzadeh, M. Ahmadi, W. C. Miller","doi":"10.1109/IWSOC.2004.22","DOIUrl":"https://doi.org/10.1109/IWSOC.2004.22","url":null,"abstract":"Automatic test equipment (ATE) capabilities have been realized using a novel embedded tester core (ETC) core designed to test large system-on-chip (SoC) implementations. The proposed ETC core appears as an additional IP core that is embedded in the system-on-chip. It can perform the advanced timing and control testing requirements that are necessary to apply the deterministic test patterns that are generated by core vendors and SoC designers. At-speed test patterns are applied to the core under test (CUT) to detect static and dynamic faults that are difficult and expensive to cover with a conventional external ATE. The ETC core is designed for at-speed testing with minimum area overhead and low power consumption in 0.18 /spl mu/m CMOS technology.","PeriodicalId":306688,"journal":{"name":"4th IEEE International Workshop on System-on-Chip for Real-Time Applications","volume":"5 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2004-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129945329","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Interfacing in microprocessor-based systems with an advanced physical addressing","authors":"M. Maamoun, B. Laichi, A. Benbelkacem, D. Berkani","doi":"10.1109/IWSOC.2004.1319887","DOIUrl":"https://doi.org/10.1109/IWSOC.2004.1319887","url":null,"abstract":"An architecture for interfacing the data exchange between microprocessor-based systems and external devices is presented. This architecture investigates the great capacity of the interfacing of extended physical addressing and uses both the direct memory access (DMA) technique and memory integration. This method will contribute to improve the speed of data exchange.","PeriodicalId":306688,"journal":{"name":"4th IEEE International Workshop on System-on-Chip for Real-Time Applications","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2003-07-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129295608","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}