Annual Symposium Reliability and Maintainability, 2004 - RAMS最新文献

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Quasi-renewal approach to spares provisioning for deteriorating systems under imperfect maintenance 不完善维护下退化系统备件供应的准更新方法
Annual Symposium Reliability and Maintainability, 2004 - RAMS Pub Date : 2004-08-24 DOI: 10.1109/RAMS.2004.1285509
Sang-Chin Yang, Shou-ling Kuo
{"title":"Quasi-renewal approach to spares provisioning for deteriorating systems under imperfect maintenance","authors":"Sang-Chin Yang, Shou-ling Kuo","doi":"10.1109/RAMS.2004.1285509","DOIUrl":"https://doi.org/10.1109/RAMS.2004.1285509","url":null,"abstract":"This paper presents algorithms for deriving optimal spares provisioning under the assumption of imperfect maintenance policies for deteriorating systems. The spares provisioning models are developed to calculate the upper and lower bounds of system availability using a generalized quasi-renewal process. It is assumed that the system will deteriorate gradually with decreasing operation and increasing repair intervals. The optimal spares investment is obtained by using the numerical approach. The annual procurement of spares can be acquired and allocated with the optimal mix and amount to fulfill the operational availability requirements. Numerical examples are presented to illustrate the models results through a set of real field data.","PeriodicalId":270494,"journal":{"name":"Annual Symposium Reliability and Maintainability, 2004 - RAMS","volume":"19 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2004-08-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126489259","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
A design tool for large scale fault-tolerant software systems 用于大规模容错软件系统的设计工具
Annual Symposium Reliability and Maintainability, 2004 - RAMS Pub Date : 2004-08-24 DOI: 10.1109/RAMS.2004.1285457
C. L. Blackmon, Meng-Lai Yin
{"title":"A design tool for large scale fault-tolerant software systems","authors":"C. L. Blackmon, Meng-Lai Yin","doi":"10.1109/RAMS.2004.1285457","DOIUrl":"https://doi.org/10.1109/RAMS.2004.1285457","url":null,"abstract":"In order to assist software designers in the application of fault-tolerance techniques to large scale software systems, a computer-aided software design tool has been proposed and implemented that assess the criticality of the software modules contained in the system. This information assists designers in identifying weaknesses in large systems that can lead to system failures. Through analysis and modeling techniques based in graph theory, modules are assessed and rated as to the criticality of their position in the software system. Graphical representation at two levels facilitates the use of cut set analysis, which is our main focus. While the task of finding all cut sets in any graph is NP-complete, the tool intelligently applies cut set analysis by limiting the problem to provide only the information needed for meaningful analysis. In this paper, we examine the methodology and algorithms used in the implementation of this tool and consider future refinements. Although further testing is needed to assess performance on increasingly complex systems, preliminary results look promising. Given the growing demand for reliable software and the complexities involved in the design of these systems, further research in this area is indicated.","PeriodicalId":270494,"journal":{"name":"Annual Symposium Reliability and Maintainability, 2004 - RAMS","volume":"5 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2004-08-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126501924","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 8
Using resource monitoring to select recovery strategies 使用资源监控来选择恢复策略
Annual Symposium Reliability and Maintainability, 2004 - RAMS Pub Date : 2004-08-24 DOI: 10.1109/RAMS.2004.1285459
R. Tirtea, Geert Deconinck, V. De Florio, R. Belmans
{"title":"Using resource monitoring to select recovery strategies","authors":"R. Tirtea, Geert Deconinck, V. De Florio, R. Belmans","doi":"10.1109/RAMS.2004.1285459","DOIUrl":"https://doi.org/10.1109/RAMS.2004.1285459","url":null,"abstract":"Distributed heterogeneous embedded systems involved in the control of infrastructures, such as electric power infrastructure, need to ensure reliable services regardless of faults and changes in the environment. A fault tolerance middleware architecture containing mechanisms for adaptation of quality-of-service (QoS) is developed to assure dependable control of the components of the infrastructure. Recovery strategies are used to allow reconfiguration of the system (e.g. graceful degradation) based on the circumstances of the failure. In this paper we present why and how available resources should be also considered together with the type of failure and the circumstances of the failure in the selection of recovery strategy. Changes in the environment such as lower resources at node levels (e.g. overload of the systems) or degradation of QoS (e.g. scarce of bandwidth in case of communication links) should be considered before allocating a new process/task to another host or before taking reconfiguration decisions. A mathematical model for generating a composite indicator based on sampled parameters is presented. The mechanism for monitoring resources at the node level is described and it is presented how this can be used in the selection of a recovery action (e.g. restart/migration of processes on/to overloaded nodes should be avoided). Also, based on the communication characteristics between distributed sites (e.g. depending availability or on cost), different recovery strategies can be selected. For this paper we consider the case of two recovery strategies and we present a mechanism for selecting the appropriate one. The fault-tolerant architecture integrating the QoS monitoring mechanism achieves dynamic reconfiguration of the recovery strategies based on the changes in the environment. Also, the QoS monitoring mechanism increases the differentiation between node crash and network problems for failure suspected nodes. Another advantage of using this mechanism is the dynamic adaptation of resource allocation for an overall increase in application availability.","PeriodicalId":270494,"journal":{"name":"Annual Symposium Reliability and Maintainability, 2004 - RAMS","volume":"43 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2004-08-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133461372","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 8
Server class disk drives: how reliable are they? 服务器级磁盘驱动器:它们有多可靠?
Annual Symposium Reliability and Maintainability, 2004 - RAMS Pub Date : 2004-08-24 DOI: 10.1109/RAMS.2004.1285439
Jon G. Elerath, Sunnyvale Sandeep Shah
{"title":"Server class disk drives: how reliable are they?","authors":"Jon G. Elerath, Sunnyvale Sandeep Shah","doi":"10.1109/RAMS.2004.1285439","DOIUrl":"https://doi.org/10.1109/RAMS.2004.1285439","url":null,"abstract":"Hard disk drive manufacturers frequently set high expectations for drive reliability from their specifications, test results and \"global returns database\". However, field reliability experienced by customers often does not match those expectations. Actual disk drive reliability may differ greatly from the manufacturer's specification and from customer to customer because of dependence on a variety of factors, some of which are completely independent of the drive design or manufacturing process. Thermal environment and duty cycle, inherent characteristics of the drive itself, architecture and logic of the system in which it is used, and the data collection and analysis process itself are all sources of significant variability. Together, these can create a range on mean time between failures (MTBF), if MTBF is indeed the correct metric, of 350,000 to 1,200,000 hours over the lifetime of a population of server class disk drives. This paper further elaborates on these four causes of variability and explains how each is responsible for a possible gap between expected and measured drive reliability.","PeriodicalId":270494,"journal":{"name":"Annual Symposium Reliability and Maintainability, 2004 - RAMS","volume":"26 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2004-08-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132201697","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 68
Reliability and robustness assessment of diagnostic systems from warranty data 基于保修数据的诊断系统的可靠性和稳健性评估
Annual Symposium Reliability and Maintainability, 2004 - RAMS Pub Date : 2004-08-24 DOI: 10.1109/RAMS.2004.1285438
Guangbin Yang, Z. Zaghati
{"title":"Reliability and robustness assessment of diagnostic systems from warranty data","authors":"Guangbin Yang, Z. Zaghati","doi":"10.1109/RAMS.2004.1285438","DOIUrl":"https://doi.org/10.1109/RAMS.2004.1285438","url":null,"abstract":"Diagnostic systems are software-intensive built-in-test systems, which detect, isolate and indicate the failures of prime systems. The use of diagnostic systems reduces the losses due to the failures of prime systems and facilitates the subsequent correct repairs. Therefore, they have found extensive applications in industry. Without loss of generality, this paper utilizes the on-board diagnostic systems of automobiles as an illustrative example. A failed diagnostic system generates /spl alpha/ or /spl beta/. /spl alpha/ error incurs unnecessary warranty costs to manufacturers, while /spl beta/ error causes potential losses to customers. Therefore, the reliability and robustness of diagnostic systems are important to both manufacturers and customers. This paper presents a method for assessing the reliability and robustness of the diagnostic systems by using warranty data. We present the definitions of robustness and reliability of the diagnostic systems, and the formulae for estimating /spl alpha/, /spl beta/ and reliability. To utilize warranty data for assessment, we describe the two-dimensional (time-in-service and mileage) warranty censoring mechanism, model the reliability function of the prime systems, and devise warranty data mining strategies. The impact of /spl alpha/ error on warranty cost is evaluated. Fault tree analyses for /spl alpha/ and /spl beta/ errors are performed to identify the ways for reliability and robustness improvement. The method is applied to assess the reliability and robustness of an automobile on-board diagnostic system.","PeriodicalId":270494,"journal":{"name":"Annual Symposium Reliability and Maintainability, 2004 - RAMS","volume":"34 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2004-08-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128829060","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Shared redundancy as a means of producing reliable mission critical systems 共享冗余作为生产可靠关键任务系统的手段
Annual Symposium Reliability and Maintainability, 2004 - RAMS Pub Date : 2004-08-24 DOI: 10.1109/RAMS.2004.1285478
J. Wysocki, R. Debouk, K. Nouri
{"title":"Shared redundancy as a means of producing reliable mission critical systems","authors":"J. Wysocki, R. Debouk, K. Nouri","doi":"10.1109/RAMS.2004.1285478","DOIUrl":"https://doi.org/10.1109/RAMS.2004.1285478","url":null,"abstract":"We address the concept of \"shared redundancy\" where one subsystem may compensate for the failure of another subsystem in the design of fault tolerant architectures for mission critical systems. We explore four different design alternatives with varying levels of physical redundancy of the components involved. The analysis shows that the system safety is defined/limited by the \"weakest link\" among the fault tolerant units, that is, the minimum level of redundancy for all the components that need to work collaboratively will define the system availability.","PeriodicalId":270494,"journal":{"name":"Annual Symposium Reliability and Maintainability, 2004 - RAMS","volume":"36 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2004-08-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127222763","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 9
An accelerated life testing model involving performance degradation 涉及性能退化的加速寿命测试模型
Annual Symposium Reliability and Maintainability, 2004 - RAMS Pub Date : 2004-08-24 DOI: 10.1109/RAMS.2004.1285469
Wenbiao Zhao, ReliaSoft Corporation, E. A. Elsayed
{"title":"An accelerated life testing model involving performance degradation","authors":"Wenbiao Zhao, ReliaSoft Corporation, E. A. Elsayed","doi":"10.1109/RAMS.2004.1285469","DOIUrl":"https://doi.org/10.1109/RAMS.2004.1285469","url":null,"abstract":"Competing risk problems involving degradation failures are becoming increasingly common and important in practice. In this paper, we investigate the modeling of competing risk problems involving both catastrophic and degradation failures under accelerated conditions. By modeling the degradation process as a Brownian motion process for which the first passage time to a boundary is considered as the soft failure, and by modeling hard failures as a Weibull distribution enable us to model accelerated testing in a natural way, make inferences about the parameters of the degradation process and predict the reliability of products at the operating conditions. The methodology is demonstrated and validated using a real case study.","PeriodicalId":270494,"journal":{"name":"Annual Symposium Reliability and Maintainability, 2004 - RAMS","volume":"148 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2004-08-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114511000","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 61
Reliability prediction based on degradation modeling for systems with multiple degradation measures 基于退化建模的多退化系统可靠性预测
Annual Symposium Reliability and Maintainability, 2004 - RAMS Pub Date : 2004-08-24 DOI: 10.1109/RAMS.2004.1285465
Peng Wang, D. Coit
{"title":"Reliability prediction based on degradation modeling for systems with multiple degradation measures","authors":"Peng Wang, D. Coit","doi":"10.1109/RAMS.2004.1285465","DOIUrl":"https://doi.org/10.1109/RAMS.2004.1285465","url":null,"abstract":"This paper describes a general modeling and analysis approach for reliability prediction based on degradation modeling, considering multiple degradation measures. Previous research has been focusing on reliability prediction based on degradation modeling at the component failure mechanism level. In reality, a system may consist of multiple components or a component may have multiple degradation paths, so it is necessary to simultaneously consider multiple degradation measures. Also, many research efforts on degradation analysis were initiated by making assumptions about the degradation mechanism. In reality often there is very limited understanding about the degradation mechanism. When the observed degradation data is collected, it is often not known which degradation model is applicable. In this paper, a general analysis procedure is developed. Simulated data were used to illustrate the applicability of this approach. It was verified that, when the multiple degradation measures in a system are correlated, an incorrect independence assumption might underestimate the system reliability.","PeriodicalId":270494,"journal":{"name":"Annual Symposium Reliability and Maintainability, 2004 - RAMS","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2004-08-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129719257","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 97
The merits and limitations of reliability predictions 可靠性预测的优点和局限性
Annual Symposium Reliability and Maintainability, 2004 - RAMS Pub Date : 2004-08-24 DOI: 10.1109/RAMS.2004.1285474
M. Economou
{"title":"The merits and limitations of reliability predictions","authors":"M. Economou","doi":"10.1109/RAMS.2004.1285474","DOIUrl":"https://doi.org/10.1109/RAMS.2004.1285474","url":null,"abstract":"A lot has been said and published about the limitations of reliability predictions based on the models first introduced by MIL-STD-217 (now MIL-HDBK-217) and commercialized by many. Some of the information in the literature denounces these methods as inaccurate and unreliable and promotes qualitative methods of ensuring reliability such as HALT/MASS, or quantitative methods such as Physics of failure, accelerated life models, etc. This paper presents the merits and limitations of reliability predictions as contrasted to reliability testing and assurance techniques from a product development standpoint. It also attempts to answer questions such as: are MIL-based reliability prediction methods useful? At what stages of the product development process it is useful? Which elements of the prediction can be practically used, and which should be discounted? How can the accuracy of reliability predictions be improved? Every method offers a certain benefit at a certain cost, is limited by a time element. No single answer exists in accurately predicting and demonstrating reliability. Balancing cost, benefit and time, the essential elements of a new product reliability & quality assurance program, provide a framework for selecting the methods. Specific, theoretical and practical examples are used to demonstrate the concepts and illustrate the methods that have been successfully used with encouraging results. In addition, useful interpretations of reliability predictions are presented, since it appears many popular misconceptions exist in the electronics industry.","PeriodicalId":270494,"journal":{"name":"Annual Symposium Reliability and Maintainability, 2004 - RAMS","volume":"73 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2004-08-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129361912","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 25
An integrated method for incorporating common cause failures in system analysis 在系统分析中纳入共因故障的集成方法
Annual Symposium Reliability and Maintainability, 2004 - RAMS Pub Date : 2004-08-24 DOI: 10.1109/RAMS.2004.1285514
Zhihua Tang, J. Dugan
{"title":"An integrated method for incorporating common cause failures in system analysis","authors":"Zhihua Tang, J. Dugan","doi":"10.1109/RAMS.2004.1285514","DOIUrl":"https://doi.org/10.1109/RAMS.2004.1285514","url":null,"abstract":"This paper proposes an integrated method for incorporating common cause failures (CCF) in system analysis. CCF are simultaneous failures of multiple components due to a common cause (CC). CCF tend to increase the joint-failure probabilities and can have dominant contribution to the system unreliability. Basically there are two methods for CCF analysis, the explicit method and the implicit method. Both methods have their own shortcomings, especially when they are applied to large-scale fault trees. Our method provides accurate and efficient CCF analysis by incorporating implicit method into binary decision diagram (BDD) and applying Markov model in dynamic fault tree (DFT) analysis. It avoids the disadvantages in the explicit method or the implicit method and is customized for currently widely-used DFT model.","PeriodicalId":270494,"journal":{"name":"Annual Symposium Reliability and Maintainability, 2004 - RAMS","volume":"11 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2004-08-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127513983","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 37
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