The merits and limitations of reliability predictions

M. Economou
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引用次数: 25

Abstract

A lot has been said and published about the limitations of reliability predictions based on the models first introduced by MIL-STD-217 (now MIL-HDBK-217) and commercialized by many. Some of the information in the literature denounces these methods as inaccurate and unreliable and promotes qualitative methods of ensuring reliability such as HALT/MASS, or quantitative methods such as Physics of failure, accelerated life models, etc. This paper presents the merits and limitations of reliability predictions as contrasted to reliability testing and assurance techniques from a product development standpoint. It also attempts to answer questions such as: are MIL-based reliability prediction methods useful? At what stages of the product development process it is useful? Which elements of the prediction can be practically used, and which should be discounted? How can the accuracy of reliability predictions be improved? Every method offers a certain benefit at a certain cost, is limited by a time element. No single answer exists in accurately predicting and demonstrating reliability. Balancing cost, benefit and time, the essential elements of a new product reliability & quality assurance program, provide a framework for selecting the methods. Specific, theoretical and practical examples are used to demonstrate the concepts and illustrate the methods that have been successfully used with encouraging results. In addition, useful interpretations of reliability predictions are presented, since it appears many popular misconceptions exist in the electronics industry.
可靠性预测的优点和局限性
关于基于MIL-STD-217(现在的MIL-HDBK-217)首次引入并被许多人商业化的模型的可靠性预测的局限性,已经有很多人说过和发表过。文献中的一些信息谴责这些方法是不准确和不可靠的,并提倡确保可靠性的定性方法,如HALT/MASS,或定量方法,如失效物理,加速寿命模型等。本文从产品开发的角度提出了可靠性预测与可靠性测试和保证技术的优点和局限性。它还试图回答以下问题:基于mil的可靠性预测方法有用吗?在产品开发过程的哪个阶段它是有用的?预测的哪些因素可以实际使用,哪些应该被忽略?如何提高可靠性预测的准确性?每一种方法都以一定的成本提供一定的好处,受到时间因素的限制。在准确预测和证明可靠性方面不存在单一的答案。平衡成本,效益和时间,新产品可靠性和质量保证计划的基本要素,为选择方法提供了一个框架。具体的、理论的和实际的例子被用来证明概念和说明方法已经成功地使用了令人鼓舞的结果。此外,提出了可靠性预测的有用解释,因为它似乎在电子工业中存在许多流行的误解。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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