Y. Shibasaki, Koji Asami, A. Kuwana, K. Machida, Yuanyang Du, Akemi Hatta, K. Kubo, Haruo Kobayashi
{"title":"Crest Factor Controlled Multi-Tone Signals for Analog/Mixed-Signal IC Testing","authors":"Y. Shibasaki, Koji Asami, A. Kuwana, K. Machida, Yuanyang Du, Akemi Hatta, K. Kubo, Haruo Kobayashi","doi":"10.1109/ITC-Asia.2019.00015","DOIUrl":"https://doi.org/10.1109/ITC-Asia.2019.00015","url":null,"abstract":"This paper investigates multi-tone signals for short-time and high quality testing of analog circuit frequency response. First, we study three multi-tone signal generation algorithms for minimum crest factor using an arbitrary waveform generator, and show that they are comparable. Then we propose crest factor controlled multi-tone signal generation algorithms for effective testing of transmitters. These algorithms are verified with simulations.","PeriodicalId":348469,"journal":{"name":"2019 IEEE International Test Conference in Asia (ITC-Asia)","volume":"21 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2019-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127448656","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}