Crest Factor Controlled Multi-Tone Signals for Analog/Mixed-Signal IC Testing

Abstract

This paper investigates multi-tone signals for short-time and high quality testing of analog circuit frequency response. First, we study three multi-tone signal generation algorithms for minimum crest factor using an arbitrary waveform generator, and show that they are comparable. Then we propose crest factor controlled multi-tone signal generation algorithms for effective testing of transmitters. These algorithms are verified with simulations.