Y. Shibasaki, Koji Asami, A. Kuwana, K. Machida, Yuanyang Du, Akemi Hatta, K. Kubo, Haruo Kobayashi
{"title":"用于模拟/混合信号IC测试的波峰因子控制多音信号","authors":"Y. Shibasaki, Koji Asami, A. Kuwana, K. Machida, Yuanyang Du, Akemi Hatta, K. Kubo, Haruo Kobayashi","doi":"10.1109/ITC-Asia.2019.00015","DOIUrl":null,"url":null,"abstract":"This paper investigates multi-tone signals for short-time and high quality testing of analog circuit frequency response. First, we study three multi-tone signal generation algorithms for minimum crest factor using an arbitrary waveform generator, and show that they are comparable. Then we propose crest factor controlled multi-tone signal generation algorithms for effective testing of transmitters. These algorithms are verified with simulations.","PeriodicalId":348469,"journal":{"name":"2019 IEEE International Test Conference in Asia (ITC-Asia)","volume":"21 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2019-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"4","resultStr":"{\"title\":\"Crest Factor Controlled Multi-Tone Signals for Analog/Mixed-Signal IC Testing\",\"authors\":\"Y. Shibasaki, Koji Asami, A. Kuwana, K. Machida, Yuanyang Du, Akemi Hatta, K. Kubo, Haruo Kobayashi\",\"doi\":\"10.1109/ITC-Asia.2019.00015\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This paper investigates multi-tone signals for short-time and high quality testing of analog circuit frequency response. First, we study three multi-tone signal generation algorithms for minimum crest factor using an arbitrary waveform generator, and show that they are comparable. Then we propose crest factor controlled multi-tone signal generation algorithms for effective testing of transmitters. These algorithms are verified with simulations.\",\"PeriodicalId\":348469,\"journal\":{\"name\":\"2019 IEEE International Test Conference in Asia (ITC-Asia)\",\"volume\":\"21 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2019-09-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"4\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2019 IEEE International Test Conference in Asia (ITC-Asia)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ITC-Asia.2019.00015\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2019 IEEE International Test Conference in Asia (ITC-Asia)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ITC-Asia.2019.00015","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Crest Factor Controlled Multi-Tone Signals for Analog/Mixed-Signal IC Testing
This paper investigates multi-tone signals for short-time and high quality testing of analog circuit frequency response. First, we study three multi-tone signal generation algorithms for minimum crest factor using an arbitrary waveform generator, and show that they are comparable. Then we propose crest factor controlled multi-tone signal generation algorithms for effective testing of transmitters. These algorithms are verified with simulations.