2016 IEEE International Reliability Physics Symposium (IRPS)

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2016 IEEE International Reliability Physics Symposium (IRPS) - 最新文献

Interposer FPGA with self-protecting ESD design for inter-die interfaces and its CDM specification

Pub Date : 2016-09-26 DOI: 10.1109/IRPS.2016.7574556 J. Karp, M. Hart, M. Fakhruddin, V. Kireev, Phoumra Tan, D. Tsaggaris, Mini Rawat

Muon-induced soft errors in 16-nm NAND flash memories

Pub Date : 2016-09-26 DOI: 10.1109/IRPS.2016.7574552 M. Bagatin, S. Gerardin, A. Paccagnella, A. Visconti, S. Beltrami, M. Bertuccio, K. Ishida, C. Frost, A. Hillier, V. Ferlet-Cavrois

Aging of I/O overdrive circuit in FinFET technology and strategy for design optimization

Pub Date : 2016-09-26 DOI: 10.1109/IRPS.2016.7574592 S. E. Liu, M. Yu, Y. Chen, J. Jao, M. Z. Lin, Y. Fang, M. Lin

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