2021 4th International Conference on Radiation Effects of Electronic Devices (ICREED)

Research on radiation hardened technology of silicon based high frequency low power transisto

Pub Date : 2021-05-26 DOI: 10.1109/icreed52909.2021.9588778 He Lv, Hongwei Zhang, B. Mei, Qingkui Yu, Yi Sun, Pengwei Li

SEU effects induced by Reactor Spallation and Accelerator neutron sources in Nano-SRAMs

Pub Date : 2021-05-26 DOI: 10.1109/icreed52909.2021.9588670 Junlin Li, Wei Chen, Wei Wu, Xiaoming Jin, Ruibin Li, Chao Qi, Minbo Liu, Yan Liu

Experiment and Simulation of Transient Ionizing Radiation Hardening in the 0.18μm CMOS LDO

Pub Date : 2021-05-26 DOI: 10.1109/icreed52909.2021.9588700 Weiyi Cao, Yuanfu Zhao, Liang Wang, Cheng-Long Sui, Xupeng Han, Ruilong Han