SEU effects induced by Reactor Spallation and Accelerator neutron sources in Nano-SRAMs

Junlin Li, Wei Chen, Wei Wu, Xiaoming Jin, Ruibin Li, Chao Qi, Minbo Liu, Yan Liu
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Abstract

This paper presents the experimental research of neutron induced single event upset (SEU) in Nano-SRAMs which was carried out in CSNS (China Spallation Neutron Source), CIAE (China institute of atomic energy) and XAPR (Xi’an pulsed reactor). The SEU cross section of Nano-SRAMs with four different feature sizes were measured. Experimental results indicated that the neutron induced SEU cross section were heavily dependent on the feature size of SRAM and the data pattern written to SRAM had little impact on the SEU cross section. We compared experimental results of white neutrons from CSNS to 2.5Mev, 14MeV neutrons from CIAE and reactor neutrons from XAPR. The comparison results showed that the neutron induced SEU cross section had a strong dependence on the energy of incident neutron. And the SEU cross section of Nano-SRAMs varies with different feature sizes obtained from different neutron sources has the same tendency.
反应堆散裂和加速器中子源在纳米sram中诱导的SEU效应
本文介绍了在中国散裂中子源(CSNS)、中国原子能科学研究院(CIAE)和西安脉冲堆(XAPR)上进行的纳米sram中子诱导单事件扰动(SEU)实验研究。测量了四种不同特征尺寸的纳米sram的SEU截面。实验结果表明,中子诱导的SEU截面严重依赖于SRAM的特征尺寸,而写入SRAM的数据模式对SEU截面的影响很小。我们比较了来自CSNS的2.5Mev、来自CIAE的14MeV中子和来自XAPR的反应堆中子的实验结果。对比结果表明,中子诱导SEU截面与入射中子的能量有很强的依赖性。从不同中子源获得的不同特征尺寸的纳米sram的SEU截面变化趋势相同。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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