2018 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA)

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2018 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) - 最新文献

Faster Localization of Logic Soft Failures Using a Combination of Scan Diagnosis at Reduced VDD and LADA

Pub Date : 2018-07-16 DOI: 10.1109/IPFA.2018.8452553 S. Goh, Y. Ngow, B. Yeoh, Edy Susanto, H. Hao, M.H. Thor, Zhao Lin, Y. Chan, J. Lam, Tay Chee Chun

Fault Isolation of Die-to-Die Communication Error Failure

Pub Date : 2018-07-01 DOI: 10.1109/IPFA.2018.8452505 Song Jinrong, T. Li, Ren Jun, Di Hairong, Yang Jianli

Case Study on Wire Bonding - Related Partial Discharge on High-Voltage Isolators

Pub Date : 2018-07-01 DOI: 10.1109/IPFA.2018.8452558 Manita Duangsang, Nophakam Thankham

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