2017 IEEE International Conference on IC Design and Technology (ICICDT)

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2017 IEEE International Conference on IC Design and Technology (ICICDT) - 最新文献

Toward Gated-Diode-BIMOS for thin silicon ESD protection in advanced FD-SOI CMOS technologies

Pub Date : 2017-05-23 DOI: 10.1109/ICICDT.2017.7993509 L. D. Conti, T. Bedecarrats, M. Vinet, S. Cristoloveanu, P. Galy

III–V-based low power CMOS devices on Si platform

Pub Date : 2017-05-23 DOI: 10.1109/ICICDT.2017.7993497 S. Takagi, D. Ahn, T. Gotow, M. Noguchi, K. Nishi, S. Kim, M. Yokoyama, C. Chang, S. Yoon, C. Yokoyama, M. Takenaka

SOTB (Silicon on Thin Buried Oxide): More than Moore technology for IoT and Automotive

Pub Date : 2017-05-23 DOI: 10.1109/ICICDT.2017.7993512 T. Hasegawa, Yoshiki Yamamoto, H. Makiyama, H. Shinkawata, S. Kamohara, Y. Yamaguchi

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