2006 International Symposium on VLSI Design, Automation and Test - 最新文献
Pub Date : 2006-04-26
DOI: 10.1109/VDAT.2006.258114
D. Lie, J. Kennedy, D. Livezey, B. Yang, T. Robinson, N. Sornin, C. Saint, L. Larson
Pub Date : 2006-04-26
DOI: 10.1109/VDAT.2006.258156
S. Tontisirin, R. Tielert
Pub Date : 2006-04-26
DOI: 10.1109/VDAT.2006.258145
Meng-Chiou Wu, Shr-Cheng Tsai, Rung-Bin Lin
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