2020 IEEE 29th Asian Test Symposium (ATS)

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2020 IEEE 29th Asian Test Symposium (ATS) - 最新文献

Summing Node Test Method: Simultaneous Multiple AC Characteristics Testing of Multiple Operational Amplifiers

Pub Date : 2020-11-23 DOI: 10.1109/ATS49688.2020.9301550 Gaku Ogihara, Takayuki Nakatani, Akemi Hatta, Keno Sato, Takashi Ishida, Toshiyuki Okamoto, Tamotsu Ichikawa, A. Kuwana, Riho Aoki, Shogo Katayama, Jianglin Wei, Yujie Zhao, Jianlong Wang, K. Hatayama, Haruo Kobayashi

Unexpected Error Explosion in NAND Flash Memory: Observations and Prediction Scheme

Pub Date : 2020-11-23 DOI: 10.1109/ATS49688.2020.9301575 Yuqian Pan, Haichun Zhang, Mingyang Gong, Zhenglin Liu

Survey: Hardware Trojan Detection for Netlist

Pub Date : 2020-11-23 DOI: 10.1109/ATS49688.2020.9301614 Yipei Yang, Jing Ye, Yuan Cao, Jiliang Zhang, Xiaowei Li, Huawei Li, Yu Hu

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