Summing Node Test Method: Simultaneous Multiple AC Characteristics Testing of Multiple Operational Amplifiers

Gaku Ogihara, Takayuki Nakatani, Akemi Hatta, Keno Sato, Takashi Ishida, Toshiyuki Okamoto, Tamotsu Ichikawa, A. Kuwana, Riho Aoki, Shogo Katayama, Jianglin Wei, Yujie Zhao, Jianlong Wang, K. Hatayama, Haruo Kobayashi
{"title":"Summing Node Test Method: Simultaneous Multiple AC Characteristics Testing of Multiple Operational Amplifiers","authors":"Gaku Ogihara, Takayuki Nakatani, Akemi Hatta, Keno Sato, Takashi Ishida, Toshiyuki Okamoto, Tamotsu Ichikawa, A. Kuwana, Riho Aoki, Shogo Katayama, Jianglin Wei, Yujie Zhao, Jianlong Wang, K. Hatayama, Haruo Kobayashi","doi":"10.1109/ATS49688.2020.9301550","DOIUrl":null,"url":null,"abstract":"This paper proposes a summing node test method for the operational amplifier and shows the followings: (i) It can be used for parallel testing of multiple AC characteristics (such as open loop gain (AOL), PSRR and CMRR) of one operational amplifier simultaneously with the equivalent accuracy but much faster compared to the NULL method. Also it can measure them even for multiple operational amplifiers at the same time. (ii) It can measure THD, SNR and THD+N of the operational amplifier with the comparable accuracy to the audio analyzer usage case, by applying proper analog filters. In other words, it can measure them with remarkable accuracy at very low cost. These have been verified with simulations and experiments. The proposed summing node test method uses an inverting operational amplifier under test and its negative input is amplified by an auxiliary non-inverting operational amplifier. The input and power supply voltages for the operational amplifier under test are modulated by AC signals with different frequencies. The auxiliary amplifier output is digitized after analog filtering and FFT is performed to the digitized data. This proposed method can reduce operational amplifier test time with good accuracy but without expensive instruments at mass production shipping, to meet the requirements for IoT and automotive as well as audio applications.","PeriodicalId":220508,"journal":{"name":"2020 IEEE 29th Asian Test Symposium (ATS)","volume":"40 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2020-11-23","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2020 IEEE 29th Asian Test Symposium (ATS)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ATS49688.2020.9301550","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
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Abstract

This paper proposes a summing node test method for the operational amplifier and shows the followings: (i) It can be used for parallel testing of multiple AC characteristics (such as open loop gain (AOL), PSRR and CMRR) of one operational amplifier simultaneously with the equivalent accuracy but much faster compared to the NULL method. Also it can measure them even for multiple operational amplifiers at the same time. (ii) It can measure THD, SNR and THD+N of the operational amplifier with the comparable accuracy to the audio analyzer usage case, by applying proper analog filters. In other words, it can measure them with remarkable accuracy at very low cost. These have been verified with simulations and experiments. The proposed summing node test method uses an inverting operational amplifier under test and its negative input is amplified by an auxiliary non-inverting operational amplifier. The input and power supply voltages for the operational amplifier under test are modulated by AC signals with different frequencies. The auxiliary amplifier output is digitized after analog filtering and FFT is performed to the digitized data. This proposed method can reduce operational amplifier test time with good accuracy but without expensive instruments at mass production shipping, to meet the requirements for IoT and automotive as well as audio applications.
求和节点测试方法:同时测试多个运放的多个交流特性
本文提出了一种运算放大器的求和节点测试方法,结果表明:(1)该方法可同时对一个运算放大器的多个交流特性(如开环增益(AOL)、PSRR和CMRR)进行并行测试,精度相当,但速度比NULL方法快得多。同时还可以对多个运放同时进行测量。(ii)通过应用适当的模拟滤波器,它可以测量运算放大器的THD、SNR和THD+N,其精度与音频分析仪的使用情况相当。换句话说,它可以以非常低的成本以惊人的精度测量它们。这些都通过仿真和实验得到了验证。所提出的求和节点测试方法使用被测反相运放,其负输入由辅助非反相运放放大。被测运算放大器的输入电压和电源电压由不同频率的交流信号调制。辅助放大器输出经过模拟滤波后数字化,并对数字化后的数据进行FFT处理。提出的方法可以减少运放测试时间,具有良好的精度,但在批量生产运输中不需要昂贵的仪器,以满足物联网和汽车以及音频应用的要求。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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