2021 IEEE International Test Conference India (ITC India)

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2021 IEEE International Test Conference India (ITC India) - 最新文献

Accelerating GLS Simulation closure in DFT with Emulator

Pub Date : 2021-07-18 DOI: 10.1109/ITCIndia52672.2021.9532898 Kriti Sundar Das, P. Prakash, A. Zala

Targeting Zero DPPM through Adoption of Advanced Fault Models and Unique Silicon Fall-out Analysis

Pub Date : 2021-07-18 DOI: 10.1109/ITCIndia52672.2021.9532687 Aravind Acharya, Nikita Naresh, P. Narayanan, R. Parekhji, Kevin Roush, Humberto Ibarra, Rajiv Sheth, Clarence Flora, Wilson Pradeep

Method and Apparatus for Bug Free Rapid Silicon Bringup

Pub Date : 2021-07-18 DOI: 10.1109/ITCIndia52672.2021.9533001 Ravikumar Patel, A. Sivakumar, Ashutosh Anand, Kirankumar A Tatti, Prakash Kumar, Shokhi Rastogi

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