Proceedings of International Electron Devices Meeting

A hot-carrier triggered SCR for smart power bus ESD protection

Pub Date : 1995-12-10 DOI: 10.1109/IEDM.1995.499210 J. Watt, A. Walker

Giga-bit scale DRAM cell with new simple Ru/(Ba,Sr)TiO/sub 3//Ru stacked capacitors using X-ray lithography

Pub Date : 1995-12-10 DOI: 10.1109/IEDM.1995.499362 Y. Nishioka, K. Shiozawa, T. Oishi, K. Kanamoto, Y. Tokuda, H. Sumitani, S. Aya, H. Yabe, K. Itoga, T. Hifumi, K. Marumoto, T. Kuroiwa, T. Kawahara, K. Nishikawa, T. Oomori, T. Fujino, S. Yamamoto, S. Uzawa, M. Kimata, M. Nunoshita, H. Abe

Resonant-cavity photodetectors

Pub Date : 1995-12-10 DOI: 10.1109/IEDM.1995.499287 J. Campbell