低电子剂量下非晶态环氧树脂的电子辐照损伤。

Kaname Yoshida, Hsin-Hui Huang, Tomohiro Miyata, Yohei K Sato, Hiroshi Jinnai
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引用次数: 1

摘要

利用电子衍射图和电子能量损失谱分析了环氧树脂样品的电子辐照损伤机理。它们的电子衍射图由三个模糊的晕环组成。对应于分子间距离为~ 6.4 Å的晕环迅速降解。这种分子尺度的坍塌可能是由分子链之间的交联引起的。电子辐照对样品的损伤程度随加速电压的变化而变化。在较高的加速电压下,由晕环强度估计的环氧树脂的耐受剂量限值得到提高。低损耗电子能谱的变化表明,环氧树脂在电子辐照初期的质量损失是显著的。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Electron irradiation damage of amorphous epoxy resin at low electron doses.

The mechanisms of electron irradiation damage to epoxy resin samples were evaluated using their electron diffraction patterns and electron energy-loss spectra. Their electron diffraction patterns consisted of three indistinct halo rings. The halo ring corresponding to an intermolecular distance of ∼6.4 Å degraded rapidly. Such molecular-scale collapse could have been caused by cross-linking between molecular chains. The degree of electron irradiation damage to the samples changed with the accelerating voltage. The tolerance dose limit of the epoxy resin estimated from the intensity of the halo ring was found to be improved at a higher accelerating voltage. Changes in low-loss electron energy-loss spectra indicated that the mass loss of the epoxy resin was remarkable in the early stage of electron irradiation.

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