{"title":"超越cmos逻辑器件基准测试的统一方法","authors":"D. Nikonov, I. Young","doi":"10.1109/IEDM.2012.6479102","DOIUrl":null,"url":null,"abstract":"A consistent methodology for benchmarking beyond CMOS logic devices was developed to guide the research directions. The promising devices - tunneling FET and spin wave devices - perform > 10<sup>15</sup> Integer Ops/s/cm<sup>2</sup> with power <; 1W/cm<sup>2</sup>.","PeriodicalId":6376,"journal":{"name":"2012 International Electron Devices Meeting","volume":"38 8","pages":"25.4.1-25.4.4"},"PeriodicalIF":0.0000,"publicationDate":"2012-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"82","resultStr":"{\"title\":\"Uniform methodology for benchmarking beyond-CMOS logic devices\",\"authors\":\"D. Nikonov, I. Young\",\"doi\":\"10.1109/IEDM.2012.6479102\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"A consistent methodology for benchmarking beyond CMOS logic devices was developed to guide the research directions. The promising devices - tunneling FET and spin wave devices - perform > 10<sup>15</sup> Integer Ops/s/cm<sup>2</sup> with power <; 1W/cm<sup>2</sup>.\",\"PeriodicalId\":6376,\"journal\":{\"name\":\"2012 International Electron Devices Meeting\",\"volume\":\"38 8\",\"pages\":\"25.4.1-25.4.4\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2012-12-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"82\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2012 International Electron Devices Meeting\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/IEDM.2012.6479102\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2012 International Electron Devices Meeting","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IEDM.2012.6479102","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Uniform methodology for benchmarking beyond-CMOS logic devices
A consistent methodology for benchmarking beyond CMOS logic devices was developed to guide the research directions. The promising devices - tunneling FET and spin wave devices - perform > 1015 Integer Ops/s/cm2 with power <; 1W/cm2.
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