界面陷阱对InAs隧道场效应管和mosfet IV曲线的影响:全量子研究

M. Pala, D. Esseni, F. Conzatti
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引用次数: 65

摘要

我们提出了第一个采用全量子输运模型来研究界面陷阱在纳米线InAs隧道场效应管和mosfet中的影响的计算研究。为此,我们介绍了基于NEGF形式和8×8 k·p哈密顿量并考虑声子散射的模拟器中界面陷阱的描述。我们的研究结果表明:(a)即使单个陷阱也会使纳米线InAs隧道场效应管的逆亚阈值斜率(SS)恶化;(b)通过界面阱的非弹性声子辅助隧穿(PAT)导致隧道场效应管IV特性的温度依赖性;(c)隧道场效应管中界面陷阱对关断的影响大于mosfet;(d)接口陷阱代表了设备可变性的一个相当大的来源。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Impact of interface traps on the IV curves of InAs Tunnel-FETs and MOSFETs: A full quantum study
We present the first computational study employing a full quantum transport model to investigate the effect of interface traps in nanowire InAs Tunnel FETs and MOSFETs. To this purpose, we introduced a description of interface traps in a simulator based on the NEGF formalism and on a 8×8 k·p Hamiltonian and accounting for phonon scattering. Our results show that: (a) even a single trap can detereorate the inverse sub-threshold slope (SS) of a nanowire InAs Tunnel FET; (b) the inelastic phonon assisted tunneling (PAT) through interface traps results in a temperature dependence of the Tunnel FETs IV characteristics; (c) the impact of interface traps on Ioff is larger in Tunnel FETs than in MOSFETs; (d) interface traps represent a sizable source of device variability.
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