锑极紫外光刻胶中的可聚合烯烃基团

Pub Date : 2021-06-11 DOI:10.2494/photopolymer.34.117
M. Murphy, N. Upadhyay, Munsaf Ali, James V. Passarelli, Jodi Grzeskowiak, Maximillian Weires, R. Brainard
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引用次数: 0

摘要

许多含有可聚合烯烃的羧酸锑配合物是高度敏感的EUV光抗胶剂。在这里,我们报告了两种方法,我们探索了可聚合烯烃锑羧酸光抗剂的反应性,以提高光刻性能。首先,我们探索了用甲基取代三个苯基以增加烯烃相对浓度与分子大小的影响。其次,我们探索了将可聚合烯烃的数量从2个增加到5个的效果。该方法考察了三(4-乙烯基苯基)锑二羧酸盐配合物作为光阻剂和显影剂化学的使用,这些显影剂能够对高度交联的底物进行图像化。
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Polymerizable Olefins Groups in Antimony EUV Photoresists
Many antimony-carboxylate complexes containing polymerizable olefins are highly sensitive EUV photoresists. Herein we report two approaches by which we explored the reactivity of polymerizable olefin antimony carboxylate photoresists to improve lithographic performance. First, we explored the effect of replacing three phenyl groups with methyl groups in an effort to increase the relative concentration of olefins vs. size of the molecule. Second, we explored the effect of increasing the number of polymerizable olefins from two to five. This approach examines the use of tris(4-vinylphenyl)antimony-dicarboxylate complexes as photoresists and the developer chemistry capable of patterning highly crosslinked substrates.
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