可靠的无铅堆砌CSP组件返工工艺

S. Iyer, K. Srihari
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引用次数: 2

摘要

内存模块制造商面临着一个持续的挑战,即在每一代新产品中融入更多的功能和卓越的性能。存储器容量需求的增长速度超过了存储器元件制造商能够经济有效地生产下一代单片存储器设备的速度。这就需要将堆叠组件用于内存模块组件。堆叠芯片级封装(CSP)组件的复杂性与无铅工艺相结合,带来了独特的返工挑战,需要研究和解决。由于焊点隐藏在组件下方,因此重新加工CSP是复杂的。可用于无铅返工工艺的工艺窗口非常狭窄。还有许多其他关键因素使返工过程复杂化并影响返工过程的可重复性。随着堆叠CSP器件的使用,复杂性只会增加。封装堆叠CSP组件的返工本质上是复杂的,是一项艰巨的任务。本文提出了与镜像封装堆叠CSP组件无铅返工相关的关键问题和观察结果。此外,本文还提供了可靠地重做这些包的方法。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Reliable Lead-Free Rework Process for Stacked CSP Components
Memory module manufacturers face an ongoing challenge to incorporate more functionality and superior performance with each new generation of product offering. The growth in demand for memory capacity is surpassing the pace at which memory component manufacturers are able to cost-effectively produce the next generation of monolithic memory devices. This drives the need for utilizing stacked components for memory module assemblies. The complex nature of stacked chip-scale package (CSP) components coupled with a lead-free process presents unique rework challenges that needed to be studied and addressed. Reworking a CSP is complicated as the solder joints are hidden underneath the component. The process window available for the lead-free rework process is very narrow. There are number of other critical factors, which complicate and affect the repeatability of the rework process. The complications only increase with the use of stacked CSP devices. The rework of package stacked CSP components, which are complex in nature, is a daunting task. The key issues and observations with regard to the issues and challenges associated with the lead-free rework of mirror-imaged package stacked CSP components has been presented in this paper. In addition, the paper also provides a recipe for reliably reworking these packages.
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