{"title":"用有机或硅衬底实现的板级倒装芯片封装的热机械可靠性优化","authors":"T. Wang, Y. Lai","doi":"10.1109/TEPM.2008.919332","DOIUrl":null,"url":null,"abstract":"A design that optimizes package-level along with board-level thermomechanical reliability of a flip-chip package implemented with an organic or a silicon substrate is provided for the package subjected to an accelerated thermal cycling test condition. Different control factors including thickness of substrate, die, board, and polyimide or soldermask are considered. The optimal design is obtained using an L9 (34) orthogonal array according to the Taguchi optimization method. Importance of each of these control factors is also ranked.","PeriodicalId":55010,"journal":{"name":"IEEE Transactions on Electronics Packaging Manufacturing","volume":"62 2 1","pages":"174-179"},"PeriodicalIF":0.0000,"publicationDate":"2008-03-31","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"5","resultStr":"{\"title\":\"Optimization of Thermomechanical Reliability of Board-Level Flip-Chip Packages Implemented With Organic or Silicon Substrates\",\"authors\":\"T. Wang, Y. Lai\",\"doi\":\"10.1109/TEPM.2008.919332\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"A design that optimizes package-level along with board-level thermomechanical reliability of a flip-chip package implemented with an organic or a silicon substrate is provided for the package subjected to an accelerated thermal cycling test condition. Different control factors including thickness of substrate, die, board, and polyimide or soldermask are considered. The optimal design is obtained using an L9 (34) orthogonal array according to the Taguchi optimization method. Importance of each of these control factors is also ranked.\",\"PeriodicalId\":55010,\"journal\":{\"name\":\"IEEE Transactions on Electronics Packaging Manufacturing\",\"volume\":\"62 2 1\",\"pages\":\"174-179\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2008-03-31\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"5\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"IEEE Transactions on Electronics Packaging Manufacturing\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/TEPM.2008.919332\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE Transactions on Electronics Packaging Manufacturing","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/TEPM.2008.919332","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Optimization of Thermomechanical Reliability of Board-Level Flip-Chip Packages Implemented With Organic or Silicon Substrates
A design that optimizes package-level along with board-level thermomechanical reliability of a flip-chip package implemented with an organic or a silicon substrate is provided for the package subjected to an accelerated thermal cycling test condition. Different control factors including thickness of substrate, die, board, and polyimide or soldermask are considered. The optimal design is obtained using an L9 (34) orthogonal array according to the Taguchi optimization method. Importance of each of these control factors is also ranked.
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