基于相似度的数据中心网络快速分析

IF 1.9 4区工程技术 Q3 COMPUTER SCIENCE, HARDWARE & ARCHITECTURE

IEEE Design & Test Pub Date : 2023-12-01 DOI:10.1109/MDAT.2023.3310450

S. Y. Narayana, Emily J. Shriver, Kenneth O'Neal, Nur Yildirim, Khamida Begaliyeva, U. Ogras

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引用次数: 0

摘要

编者按:本文的作者提出了一种新颖的基于相似性的技术，该技术将相似的流聚类，在不影响准确性的情况下实现高速度。-Mahdi Nikdast，美国科罗拉多州立大学-Miquel Moreto，西班牙巴塞罗那超级计算中心-Masoumeh (Azin) Ebrahimi，瑞典皇家理工学院-Sujay Deb，印度德里IIIT

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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Similarity-Based Fast Analysis of Data Center Networks

Editor’s notes: The authors in this article present a novel similarity-based technique that clusters similar flows, achieving high speedups without compromising accuracy. —Mahdi Nikdast, Colorado State University, USA —Miquel Moreto, Barcelona Supercomputing Center, Spain —Masoumeh (Azin) Ebrahimi, KTH Royal Institute of Technology, Sweden —Sujay Deb, IIIT Delhi, India

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来源期刊

IEEE Design & Test COMPUTER SCIENCE, HARDWARE & ARCHITECTURE-ENGINEERING, ELECTRICAL & ELECTRONIC

CiteScore

3.80

自引率

5.00%

发文量

期刊介绍： IEEE Design & Test offers original works describing the models, methods, and tools used to design and test microelectronic systems from devices and circuits to complete systems-on-chip and embedded software. The magazine focuses on current and near-future practice, and includes tutorials, how-to articles, and real-world case studies. The magazine seeks to bring to its readers not only important technology advances but also technology leaders, their perspectives through its columns, interviews, and roundtable discussions. Topics include semiconductor IC design, semiconductor intellectual property blocks, design, verification and test technology, design for manufacturing and yield, embedded software and systems, low-power and energy-efficient design, electronic design automation tools, practical technology, and standards.