{"title":"负电容晶体管中负漏极诱导势垒降低和负差分电阻效应","authors":"Tianyu Yu, Wei-feng Lü, Zhifeng Zhao, Peng Si, Kai Zhang","doi":"10.1016/j.mejo.2020.104981","DOIUrl":null,"url":null,"abstract":"","PeriodicalId":18617,"journal":{"name":"Microelectron. J.","volume":"94 1","pages":"104981"},"PeriodicalIF":0.0000,"publicationDate":"2021-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"16","resultStr":"{\"title\":\"Negative drain-induced barrier lowering and negative differential resistance effects in negative-capacitance transistors\",\"authors\":\"Tianyu Yu, Wei-feng Lü, Zhifeng Zhao, Peng Si, Kai Zhang\",\"doi\":\"10.1016/j.mejo.2020.104981\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"\",\"PeriodicalId\":18617,\"journal\":{\"name\":\"Microelectron. J.\",\"volume\":\"94 1\",\"pages\":\"104981\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2021-01-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"16\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Microelectron. J.\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1016/j.mejo.2020.104981\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Microelectron. J.","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1016/j.mejo.2020.104981","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 16