利用交变相位聚焦技术在纳米光子芯片上传输电子束的实验考虑

IF 1.4 4区 工程技术
R. Shiloh, T. Chlouba, P. Hommelhoff
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引用次数: 2

摘要

在激光发明后不久,它就被标记为用于加速粒子的强高频电磁辐射的候选源。事实上,虽然今天复杂的粒子加速器设备是几代物理学家、工程师和一大批科学家几十年努力的惊人成果,但新的趋势和加速技术最近才被提出和证明。其中一项技术涉及粒子加速器的小型化,这是通过使用激光将加速粒子的射频电磁场替换为光学频率范围内的场来实现的。这需要使用纳米光子结构来提供所需的场分布。最近,已经证明了射频加速器的纳米光子对应物的单个元素。同样,基于交替相位聚焦的概念,已经证明了通过这种结构的主动电子传递。在这篇文章中,我们讨论和增强了最近证明的使用光学频率的交替相位聚焦原理,并从相关的模拟和实验中提供了新的见解。特别是,我们展示了如何从时间延迟扫描中识别可能的不精确和寄生效应,并讨论了电子通过纳米结构的传输如何依赖于电子和激光脉冲之间的时间重叠,并展示了电子束的入射角如何影响通过结构的测量电子传输。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Experimental considerations in electron beam transport on a nanophotonic chip using alternating phase focusing
Not long after the laser was invented, it has been marked as a candidate source of strong, high-frequency electromagnetic radiation for acceleration of particles. Indeed, while the complex particle accelerator facilities today are an astonishing culmination of decades of work contributed by generations of physicists, engineers, and a host of scientists, new trends and acceleration technologies have been recently proposed and demonstrated. One of these technologies involves the miniaturization of particle accelerators, which is achieved by replacing the radio-frequency electromagnetic fields accelerating the particles with fields in the optical frequency range, using lasers. This entails using nanophotonics structures to provide the required field distribution. Recently, individual elements towards the nanophotonics counterpart of RF accelerators have been demonstrated. Similarly, active electron transport through such a structure has been shown, which was based on the concept of alternating phase focusing. In this contribution, we discuss and augment on the recently-demonstrated principle of alternating phase focusing using optical frequencies, and provide new insights from relevant simulations and experiments. In particular, we show how to identify possible imprecisions and parasitic effects from time delay scans and discuss how the transmission of electrons through the nanometric structure depends on the temporal overlap between electron and laser pulses, and show how the incidence angle of the electron beam can affect the measured transmission of electrons through the structure.
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来源期刊
Journal of Vacuum Science & Technology B
Journal of Vacuum Science & Technology B 工程技术-工程:电子与电气
自引率
14.30%
发文量
0
审稿时长
2.5 months
期刊介绍: Journal of Vacuum Science & Technology B emphasizes processing, measurement and phenomena associated with micrometer and nanometer structures and devices. Processing may include vacuum processing, plasma processing and microlithography among others, while measurement refers to a wide range of materials and device characterization methods for understanding the physics and chemistry of submicron and nanometer structures and devices.
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