高速封装设计及电气性能分析

Shu-Qiang Zhang, Hung-Hsiang Cheng, Yin-Guang Zheng, Chang-Lin Yeh
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引用次数: 2

摘要

快速IO、超高速传输、千兆以太网、串行ATA等高速数据传输格式越来越流行。随着衬底互连密度和信道数据速率的不断提高,各种三维效应、串扰和不连续诱发的ISI对信号通道和配电网络都起着越来越重要的作用。基板互连结构正成为大多数封装设计师的主要带宽限制。随着数据速率的不断增加,过渡到焊接凸点或金螺柱凸点倒装芯片互连或低损耗基板材料会导致成本过高。因此,提供高性能和低成本的包装解决方案变得越来越重要。本文的目的是提出一种用于高速器件的普通塑料球栅阵列(PBGA)封装设计方案。重点介绍了信号通路结构、导线键合、通孔通孔、球体放置策略和镀段等封装设计参数变化对其影响的电学仿真方法。本文的结论对高速封装电气设计具有一定的参考价值。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
High speed package design and electrical performance analysis
More and more high-speed data transmission formats such as rapid IO, hyper transport, Gigabit Ethernet, Serial ATA etc. are becoming prevalent. As substrate interconnection density and channel data rate are getting increasingly higher, various 3D effects, crosstalk, and discontinuity - induced ISI are playing a much more important role, for both signal channels and power distribution networks . The substrate interconnection structures are becoming the major bandwidth constraint for most of the package designer. As data rates continue to increase, transitioning to solder bump or Au stud bump flip-chip interconnects or low-loss substrate materials results in excessive cost. It is therefore increasingly important to provide a high performance and low-cost packaging solution. The aim of this paper is to proposal a design solution of normal plastic ball grid array (PBGA) package for high speed devices. The electrical simulation method of the effects of variation of package design parameters such as signal path structure, wire bonding, through hole via, ball placement tactic and plating stub are highlighted. The conclusion of this paper is recommendation for high-speed package electrical design.
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