基于chlogenide玻璃的高可扩展阈值开关选择器件,用于3D纳米级存储阵列

Myoung-Jae Lee, Dongsoo Lee, Hojung Kim, Hyun-Sik Choi, Jong-bong Park, Hee-Goo Kim, Y. Cha, U. Chung, I. Yoo, Kinam Kim
{"title":"基于chlogenide玻璃的高可扩展阈值开关选择器件,用于3D纳米级存储阵列","authors":"Myoung-Jae Lee, Dongsoo Lee, Hojung Kim, Hyun-Sik Choi, Jong-bong Park, Hee-Goo Kim, Y. Cha, U. Chung, I. Yoo, Kinam Kim","doi":"10.1109/IEDM.2012.6478966","DOIUrl":null,"url":null,"abstract":"We present here on a switch device made of a nitridized-chalcogenide glass for application in nanoscale array circuits. Previously, AsTeGeSi-based switches have had key issues with performance degradation over time. This is usually due to changes in the Te concentration in the device active region [1-3]. However, our AsTeGeSiN switches were able to overcome this limitation as well as scale down to 30 nm with an on current of 100 μA (J > 1.1×107A/cm2). Their cycling performance was shown to be greater than 108. Also, we demonstrate a memory cell using a TaOx resistance memory with the AsTeGeSiN select device.","PeriodicalId":6376,"journal":{"name":"2012 International Electron Devices Meeting","volume":"53 1","pages":"2.6.1-2.6.3"},"PeriodicalIF":0.0000,"publicationDate":"2012-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"67","resultStr":"{\"title\":\"Highly-scalable threshold switching select device based on chaclogenide glasses for 3D nanoscaled memory arrays\",\"authors\":\"Myoung-Jae Lee, Dongsoo Lee, Hojung Kim, Hyun-Sik Choi, Jong-bong Park, Hee-Goo Kim, Y. Cha, U. Chung, I. Yoo, Kinam Kim\",\"doi\":\"10.1109/IEDM.2012.6478966\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"We present here on a switch device made of a nitridized-chalcogenide glass for application in nanoscale array circuits. Previously, AsTeGeSi-based switches have had key issues with performance degradation over time. This is usually due to changes in the Te concentration in the device active region [1-3]. However, our AsTeGeSiN switches were able to overcome this limitation as well as scale down to 30 nm with an on current of 100 μA (J > 1.1×107A/cm2). Their cycling performance was shown to be greater than 108. Also, we demonstrate a memory cell using a TaOx resistance memory with the AsTeGeSiN select device.\",\"PeriodicalId\":6376,\"journal\":{\"name\":\"2012 International Electron Devices Meeting\",\"volume\":\"53 1\",\"pages\":\"2.6.1-2.6.3\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2012-12-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"67\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2012 International Electron Devices Meeting\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/IEDM.2012.6478966\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2012 International Electron Devices Meeting","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IEDM.2012.6478966","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 67

摘要

本文介绍了一种应用于纳米阵列电路的氮化硫系玻璃开关器件。以前,基于asstegesi的交换机存在性能下降的关键问题。这通常是由于器件活性区域Te浓度的变化[1-3]。然而,我们的asstegesin开关能够克服这一限制,并缩小到30 nm,导通电流为100 μA (J > 1.1×107A/cm2)。他们的自行车成绩超过108。此外,我们还演示了使用TaOx电阻存储器和asstegesin选择器件的存储单元。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Highly-scalable threshold switching select device based on chaclogenide glasses for 3D nanoscaled memory arrays
We present here on a switch device made of a nitridized-chalcogenide glass for application in nanoscale array circuits. Previously, AsTeGeSi-based switches have had key issues with performance degradation over time. This is usually due to changes in the Te concentration in the device active region [1-3]. However, our AsTeGeSiN switches were able to overcome this limitation as well as scale down to 30 nm with an on current of 100 μA (J > 1.1×107A/cm2). Their cycling performance was shown to be greater than 108. Also, we demonstrate a memory cell using a TaOx resistance memory with the AsTeGeSiN select device.
求助全文
通过发布文献求助,成功后即可免费获取论文全文。 去求助
来源期刊
自引率
0.00%
发文量
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术官方微信