所有的场发射模型都是错误的,但其中有有用的吗?

IF 1.4 4区 工程技术
A. Ayari, P. Vincent, S. Perisanu, P. Poncharal, S. Purcell
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引用次数: 9

摘要

场发射数据通常用Fowler-Nordheim图表示,但最近提出了一个新的经验方程来更好地分析实验。这样的方程是基于Murphy和Good模型的近似,并预测一个常数参数κ,仅依赖于发射器的功函数,可以从数据中提取。我们将此经验方程与Murphy和Good模型的模拟进行了比较,以确定近似的有效性范围以及κ与功函数之间关系的鲁棒性。我们发现κ仅在有限的电场范围内是恒定的,因此在很大程度上取决于电场增强因子。这一结果使人们对新经验方程的有效性产生了疑问。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
All field emission models are wrong, … but are any of them useful?
Field emission data are often represented on a Fowler-Nordheim plot, but a new empirical equation has been recently proposed to better analyse experiments. Such an equation is based on approximations of the Murphy and Good model and predicts that a constant parameter κ , depending only on the work function of the emitter, can be extracted from the data. We compared this empirical equation with simulations of the Murphy and Good model in order to determine the range of validity of the approximations and the robustness of the relationship between κ and the work function. We found that κ is constant only over a limited range of electric fields and so depends significantly on the field enhancement factor. This result calls into question the usefulness of the new empirical equation.
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来源期刊
Journal of Vacuum Science & Technology B
Journal of Vacuum Science & Technology B 工程技术-工程:电子与电气
自引率
14.30%
发文量
0
审稿时长
2.5 months
期刊介绍: Journal of Vacuum Science & Technology B emphasizes processing, measurement and phenomena associated with micrometer and nanometer structures and devices. Processing may include vacuum processing, plasma processing and microlithography among others, while measurement refers to a wide range of materials and device characterization methods for understanding the physics and chemistry of submicron and nanometer structures and devices.
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