{"title":"决策树在集成电路成品率提高中的应用","authors":"V. Raghavan","doi":"10.1109/ASMC.2002.1001615","DOIUrl":null,"url":null,"abstract":"In order to meet high expectations on yield targets, quick identification of root cause for yield loss is essential. Decision trees are shown to be a powerful data mining tool for integrated circuit yield improvement. Several case studies from yield improvement efforts on real products have been presented.","PeriodicalId":64779,"journal":{"name":"半导体技术","volume":null,"pages":null},"PeriodicalIF":0.0000,"publicationDate":"2002-08-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"7","resultStr":"{\"title\":\"Application of decision trees for integrated circuit yield improvement\",\"authors\":\"V. Raghavan\",\"doi\":\"10.1109/ASMC.2002.1001615\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"In order to meet high expectations on yield targets, quick identification of root cause for yield loss is essential. Decision trees are shown to be a powerful data mining tool for integrated circuit yield improvement. Several case studies from yield improvement efforts on real products have been presented.\",\"PeriodicalId\":64779,\"journal\":{\"name\":\"半导体技术\",\"volume\":null,\"pages\":null},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2002-08-07\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"7\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"半导体技术\",\"FirstCategoryId\":\"1087\",\"ListUrlMain\":\"https://doi.org/10.1109/ASMC.2002.1001615\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"半导体技术","FirstCategoryId":"1087","ListUrlMain":"https://doi.org/10.1109/ASMC.2002.1001615","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Application of decision trees for integrated circuit yield improvement
In order to meet high expectations on yield targets, quick identification of root cause for yield loss is essential. Decision trees are shown to be a powerful data mining tool for integrated circuit yield improvement. Several case studies from yield improvement efforts on real products have been presented.
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