Seong-Geon Park, M. Yang, H. Ju, D. Seong, Jung Moo Lee, Eunmi Kim, Seungjae Jung, Lijie Zhang, Yoocheol Shin, I. Baek, Jungdal Choi, Ho-Kyu Kang, C. Chung
{"title":"用于高密度垂直电阻式存储器(VRRAM)的亚1μA超低工作电流非线性单元","authors":"Seong-Geon Park, M. Yang, H. Ju, D. Seong, Jung Moo Lee, Eunmi Kim, Seungjae Jung, Lijie Zhang, Yoocheol Shin, I. Baek, Jungdal Choi, Ho-Kyu Kang, C. Chung","doi":"10.1109/IEDM.2012.6479084","DOIUrl":null,"url":null,"abstract":"A non-linear RRAM cell with sub-1μA ultralow operating current has been successfully fabricated for high density vertical ReRAM (VRRAM) applications. A uniform and reproducible low power resistive switching was achieved by engineering transition metal oxides and imposing thin insulating layer as a tunnel barrier. The non-linear I-V characteristics ensure the possible incorporation of RRAM cell into high density cross-type array structure including VRRAM. By varying the current compliance, a multi level switching behavior was obtained. Moreover, excellent endurance of more than 107 cycles without read disturbance for up to 104 seconds was demonstrated.","PeriodicalId":6376,"journal":{"name":"2012 International Electron Devices Meeting","volume":"100 1","pages":"20.8.1-20.8.4"},"PeriodicalIF":0.0000,"publicationDate":"2012-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"75","resultStr":"{\"title\":\"A non-linear ReRAM cell with sub-1μA ultralow operating current for high density vertical resistive memory (VRRAM)\",\"authors\":\"Seong-Geon Park, M. Yang, H. Ju, D. Seong, Jung Moo Lee, Eunmi Kim, Seungjae Jung, Lijie Zhang, Yoocheol Shin, I. Baek, Jungdal Choi, Ho-Kyu Kang, C. Chung\",\"doi\":\"10.1109/IEDM.2012.6479084\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"A non-linear RRAM cell with sub-1μA ultralow operating current has been successfully fabricated for high density vertical ReRAM (VRRAM) applications. A uniform and reproducible low power resistive switching was achieved by engineering transition metal oxides and imposing thin insulating layer as a tunnel barrier. The non-linear I-V characteristics ensure the possible incorporation of RRAM cell into high density cross-type array structure including VRRAM. By varying the current compliance, a multi level switching behavior was obtained. Moreover, excellent endurance of more than 107 cycles without read disturbance for up to 104 seconds was demonstrated.\",\"PeriodicalId\":6376,\"journal\":{\"name\":\"2012 International Electron Devices Meeting\",\"volume\":\"100 1\",\"pages\":\"20.8.1-20.8.4\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2012-12-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"75\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2012 International Electron Devices Meeting\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/IEDM.2012.6479084\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2012 International Electron Devices Meeting","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IEDM.2012.6479084","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
A non-linear ReRAM cell with sub-1μA ultralow operating current for high density vertical resistive memory (VRRAM)
A non-linear RRAM cell with sub-1μA ultralow operating current has been successfully fabricated for high density vertical ReRAM (VRRAM) applications. A uniform and reproducible low power resistive switching was achieved by engineering transition metal oxides and imposing thin insulating layer as a tunnel barrier. The non-linear I-V characteristics ensure the possible incorporation of RRAM cell into high density cross-type array structure including VRRAM. By varying the current compliance, a multi level switching behavior was obtained. Moreover, excellent endurance of more than 107 cycles without read disturbance for up to 104 seconds was demonstrated.