380v/1.9A GaN功率- hemt:高压下电流坍缩现象及27.1 MHz e类放大器演示

Wataru Saito, M. Kuraguchi, Y. Takada, K. Tsuda, T. Domon, Ichiro Omura, Masakazu Yamaguchi
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引用次数: 18

摘要

报道了用于高压电力电子应用的380V/1.9A GaN功率hemt的电流坍缩现象。利用27.1 MHz的e类放大器,讨论了这些现象对高电压下电力电子电路性能的影响,该放大器可以作为工业应用的候选之一。研究发现,优化后的场极板结构使电流坍缩现象导致的导通损耗增加最小化,从而提高了电路的功率效率。在漏极电压为330 V、开关频率为27.1 MHz的情况下,该器件的输出功率为13.8 W,功率效率为89.6%。这些结果显示了一种新型gan器件在高压和高频条件下应用的本质可能性
本文章由计算机程序翻译,如有差异,请以英文原文为准。
380v/1.9A GaN power-HEMT: current collapse phenomena under high applied voltage and demonstration of 27.1 MHz class-E amplifier
The current collapse phenomena in 380V/1.9A GaN power-HEMTs designed for high-voltage power electronics application is reported. The influence of these phenomena to the power-electronics circuit performance under high applied voltage is discussed using a 27.1 MHz class-E amplifier, which can be one of an industrial application candidate. It has been found that the optimized field plate structure minimizes the increase of conduction loss caused by the current collapse phenomena and thus improves the power efficiency of the circuit. The minimized device achieved the output power of 13.8 W and the power efficiency of 89.6 % for the demonstrated circuit even with the applied drain voltage of 330 V and the switching frequency of 27.1 MHz. These results show the nature possibility of a new GaN-device application with both high voltage and high frequency condition
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