Y. Zeng, Hongzhen Chu, Ning Wei, Yuehua Li, Xinlin Wang, Hongyu He
{"title":"5T1C像素电路补偿迁移率和阈值电压变化","authors":"Y. Zeng, Hongzhen Chu, Ning Wei, Yuehua Li, Xinlin Wang, Hongyu He","doi":"10.1016/j.mejo.2021.105283","DOIUrl":null,"url":null,"abstract":"","PeriodicalId":18617,"journal":{"name":"Microelectron. J.","volume":"136 1","pages":"105283"},"PeriodicalIF":0.0000,"publicationDate":"2021-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"3","resultStr":"{\"title\":\"A 5T1C pixel circuit compensating mobility and threshold voltage variation\",\"authors\":\"Y. Zeng, Hongzhen Chu, Ning Wei, Yuehua Li, Xinlin Wang, Hongyu He\",\"doi\":\"10.1016/j.mejo.2021.105283\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"\",\"PeriodicalId\":18617,\"journal\":{\"name\":\"Microelectron. J.\",\"volume\":\"136 1\",\"pages\":\"105283\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2021-10-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"3\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Microelectron. J.\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1016/j.mejo.2021.105283\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Microelectron. J.","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1016/j.mejo.2021.105283","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 3