Zhang Jinyi, Yang Xiaodong, Yang Yi, Zhang Dong, Dong Hui
{"title":"SOC互连故障的3 - cl测试","authors":"Zhang Jinyi, Yang Xiaodong, Yang Yi, Zhang Dong, Dong Hui","doi":"10.1109/ICEPT.2008.4607018","DOIUrl":null,"url":null,"abstract":"Shrinks of feature size, high working frequency, and rising number of the IP cores integrated in SOC make the problem with interconnection test critics. A March-CL test for interconnection faults of SOC is proposed in this article. According to the method, eight test patterns are used to detect stuck and delay faults of interconnection between IP cores. The IP connected by interconnection under test (IUT) is wrapped and complied with IEEE1500. Short test time and low area overhead are achieved with the method. Moreover, modified wrapper cell structure with simple control logic is adopted for detecting delay in March-CL test. Finally, March-CL test is applied to ITCpsila02 bench, and result proves that the method covers 100% of stuck, bridge and delay faults in synchronous interconnection test.","PeriodicalId":6324,"journal":{"name":"2008 International Conference on Electronic Packaging Technology & High Density Packaging","volume":"31 1","pages":"1-5"},"PeriodicalIF":0.0000,"publicationDate":"2008-07-28","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"A March-CL test for interconnection faults of SOC\",\"authors\":\"Zhang Jinyi, Yang Xiaodong, Yang Yi, Zhang Dong, Dong Hui\",\"doi\":\"10.1109/ICEPT.2008.4607018\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Shrinks of feature size, high working frequency, and rising number of the IP cores integrated in SOC make the problem with interconnection test critics. A March-CL test for interconnection faults of SOC is proposed in this article. According to the method, eight test patterns are used to detect stuck and delay faults of interconnection between IP cores. The IP connected by interconnection under test (IUT) is wrapped and complied with IEEE1500. Short test time and low area overhead are achieved with the method. Moreover, modified wrapper cell structure with simple control logic is adopted for detecting delay in March-CL test. Finally, March-CL test is applied to ITCpsila02 bench, and result proves that the method covers 100% of stuck, bridge and delay faults in synchronous interconnection test.\",\"PeriodicalId\":6324,\"journal\":{\"name\":\"2008 International Conference on Electronic Packaging Technology & High Density Packaging\",\"volume\":\"31 1\",\"pages\":\"1-5\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2008-07-28\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2008 International Conference on Electronic Packaging Technology & High Density Packaging\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ICEPT.2008.4607018\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2008 International Conference on Electronic Packaging Technology & High Density Packaging","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICEPT.2008.4607018","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Shrinks of feature size, high working frequency, and rising number of the IP cores integrated in SOC make the problem with interconnection test critics. A March-CL test for interconnection faults of SOC is proposed in this article. According to the method, eight test patterns are used to detect stuck and delay faults of interconnection between IP cores. The IP connected by interconnection under test (IUT) is wrapped and complied with IEEE1500. Short test time and low area overhead are achieved with the method. Moreover, modified wrapper cell structure with simple control logic is adopted for detecting delay in March-CL test. Finally, March-CL test is applied to ITCpsila02 bench, and result proves that the method covers 100% of stuck, bridge and delay faults in synchronous interconnection test.