p沟道隧道场效应晶体管(ttfet)的直接带对带隧穿:锗锡(GeSn)技术实现

Yue Yang, S. Su, P. Guo, Wei Wang, X. Gong, Lanxiang Wang, Kain Lu Low, Guangze Zhang, C. Xue, B. Cheng, G. Han, Y. Yeo
{"title":"p沟道隧道场效应晶体管(ttfet)的直接带对带隧穿:锗锡(GeSn)技术实现","authors":"Yue Yang, S. Su, P. Guo, Wei Wang, X. Gong, Lanxiang Wang, Kain Lu Low, Guangze Zhang, C. Xue, B. Cheng, G. Han, Y. Yeo","doi":"10.1109/IEDM.2012.6479053","DOIUrl":null,"url":null,"abstract":"In this work, we report the first demonstration of GeSn pTFET. Good device characteristics were obtained. This may be attributed to direct BTBT, high hole mobility in the GeSn channel, and the formation of abruptly and heavily doped N+ source. The ION performance can be improved with further device optimization.","PeriodicalId":6376,"journal":{"name":"2012 International Electron Devices Meeting","volume":"29 1","pages":"16.3.1-16.3.4"},"PeriodicalIF":0.0000,"publicationDate":"2012-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"61","resultStr":"{\"title\":\"Towards direct band-to-band tunneling in P-channel tunneling field effect transistor (TFET): Technology enablement by Germanium-tin (GeSn)\",\"authors\":\"Yue Yang, S. Su, P. Guo, Wei Wang, X. Gong, Lanxiang Wang, Kain Lu Low, Guangze Zhang, C. Xue, B. Cheng, G. Han, Y. Yeo\",\"doi\":\"10.1109/IEDM.2012.6479053\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"In this work, we report the first demonstration of GeSn pTFET. Good device characteristics were obtained. This may be attributed to direct BTBT, high hole mobility in the GeSn channel, and the formation of abruptly and heavily doped N+ source. The ION performance can be improved with further device optimization.\",\"PeriodicalId\":6376,\"journal\":{\"name\":\"2012 International Electron Devices Meeting\",\"volume\":\"29 1\",\"pages\":\"16.3.1-16.3.4\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2012-12-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"61\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2012 International Electron Devices Meeting\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/IEDM.2012.6479053\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2012 International Electron Devices Meeting","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IEDM.2012.6479053","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 61

摘要

在这项工作中,我们报道了GeSn pTFET的首次演示。获得了良好的器件特性。这可能归因于直接的BTBT, GeSn通道中高空穴迁移率以及突然和重掺杂N+源的形成。离子性能可以通过进一步的器件优化来提高。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Towards direct band-to-band tunneling in P-channel tunneling field effect transistor (TFET): Technology enablement by Germanium-tin (GeSn)
In this work, we report the first demonstration of GeSn pTFET. Good device characteristics were obtained. This may be attributed to direct BTBT, high hole mobility in the GeSn channel, and the formation of abruptly and heavily doped N+ source. The ION performance can be improved with further device optimization.
求助全文
通过发布文献求助,成功后即可免费获取论文全文。 去求助
来源期刊
自引率
0.00%
发文量
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术官方微信