{"title":"具有电子能量源滤波器的III-V型mosfet的性能比较","authors":"K. Lam, Y. Yeo, G. Liang","doi":"10.1109/IEDM.2012.6479062","DOIUrl":null,"url":null,"abstract":"We evaluated the performances of two high-energy-electrons filtering MOSFET designs, the superlattice source-extension (SL) MOSFET and the p<sup>+</sup>/n<sup>+</sup> source-junction (p<sup>+</sup>n<sup>+</sup> source) MOSFET, using the sp<sup>3</sup>d<sup>5</sup>s* full-band tight-binding model, coupled with a non-equilibrium Green's function quantum transport simulator in the ballistic regime. III-V semicoductor heterojunctions made up of GaAs and In<sub>53</sub>Ga<sub>47</sub>As are investigated and the optimizing parameters such as the length of the barrier and well regions for the SL-MOSFETs and the doping concentrations and the length of n<sup>+</sup> region for the p<sup>+</sup>n<sup>+</sup> source MOSFETs are varied to understand their effects on the device performance parameters. More detailed interactions between electrons are considered in the present full-band simulations. Our optimized SL-MOSFET and p<sup>+</sup>n<sup>+</sup> source MOSFET achieve I<sub>ON</sub> = 0.81 and 0.60 mA/μm, SS = 20.9 and 23.1mV/dec@V<sub>DS</sub>=0.6V, respectively.","PeriodicalId":6376,"journal":{"name":"2012 International Electron Devices Meeting","volume":"22 1","pages":"17.6.1-17.6.4"},"PeriodicalIF":0.0000,"publicationDate":"2012-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"3","resultStr":"{\"title\":\"Performance comparison of III-V MOSFETs with source filter for electron energy\",\"authors\":\"K. Lam, Y. Yeo, G. Liang\",\"doi\":\"10.1109/IEDM.2012.6479062\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"We evaluated the performances of two high-energy-electrons filtering MOSFET designs, the superlattice source-extension (SL) MOSFET and the p<sup>+</sup>/n<sup>+</sup> source-junction (p<sup>+</sup>n<sup>+</sup> source) MOSFET, using the sp<sup>3</sup>d<sup>5</sup>s* full-band tight-binding model, coupled with a non-equilibrium Green's function quantum transport simulator in the ballistic regime. III-V semicoductor heterojunctions made up of GaAs and In<sub>53</sub>Ga<sub>47</sub>As are investigated and the optimizing parameters such as the length of the barrier and well regions for the SL-MOSFETs and the doping concentrations and the length of n<sup>+</sup> region for the p<sup>+</sup>n<sup>+</sup> source MOSFETs are varied to understand their effects on the device performance parameters. More detailed interactions between electrons are considered in the present full-band simulations. Our optimized SL-MOSFET and p<sup>+</sup>n<sup>+</sup> source MOSFET achieve I<sub>ON</sub> = 0.81 and 0.60 mA/μm, SS = 20.9 and 23.1mV/dec@V<sub>DS</sub>=0.6V, respectively.\",\"PeriodicalId\":6376,\"journal\":{\"name\":\"2012 International Electron Devices Meeting\",\"volume\":\"22 1\",\"pages\":\"17.6.1-17.6.4\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2012-12-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"3\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2012 International Electron Devices Meeting\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/IEDM.2012.6479062\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2012 International Electron Devices Meeting","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IEDM.2012.6479062","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 3
摘要
我们使用sp3d5s*全波段紧密结合模型,结合非平衡格林函数量子输运模拟器,评估了两种高能电子滤波MOSFET设计的性能,即超晶格源-扩展(SL) MOSFET和p+/n+源-结(p+n+源)MOSFET。研究了由GaAs和In53Ga47As组成的III-V型半导体异质结,并对sl - mosfet的势垒和阱区长度以及p+n+源mosfet的掺杂浓度和n+区长度等优化参数进行了研究,以了解它们对器件性能参数的影响。在目前的全波段模拟中考虑了电子之间更详细的相互作用。我们优化的SL-MOSFET和p+n+源MOSFET分别实现了离子= 0.81和0.60 mA/μm, SS = 20.9和23.1mV/dec@VDS=0.6V。
Performance comparison of III-V MOSFETs with source filter for electron energy
We evaluated the performances of two high-energy-electrons filtering MOSFET designs, the superlattice source-extension (SL) MOSFET and the p+/n+ source-junction (p+n+ source) MOSFET, using the sp3d5s* full-band tight-binding model, coupled with a non-equilibrium Green's function quantum transport simulator in the ballistic regime. III-V semicoductor heterojunctions made up of GaAs and In53Ga47As are investigated and the optimizing parameters such as the length of the barrier and well regions for the SL-MOSFETs and the doping concentrations and the length of n+ region for the p+n+ source MOSFETs are varied to understand their effects on the device performance parameters. More detailed interactions between electrons are considered in the present full-band simulations. Our optimized SL-MOSFET and p+n+ source MOSFET achieve ION = 0.81 and 0.60 mA/μm, SS = 20.9 and 23.1mV/dec@VDS=0.6V, respectively.