应用于机械抛光奥氏体不锈钢试样近表面残余应力和晶粒相互作用的无损深度分辨分析新方法

IF 5.2 2区 工程技术 Q1 ENGINEERING, MULTIDISCIPLINARY
M. Marciszko-Wiąckowska , A. Oponowicz , A. Baczmański , Ch. Braham , M. Wątroba , M. Wróbel , M. Klaus , Ch. Genzel
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引用次数: 2

摘要

晶粒相互作用模型的选择是用衍射法分析残余应力的关键因素。对于机械抛光的奥氏体钢的近表面区域,表明广泛使用的Eshelby-Kröner模型的应用不能导致与实验观察结果满意的吻合。因此,提出了一种新的晶粒相互作用模型,称为“可调自由表面”,允许确定晶粒之间弹性相互作用的深入演变。它具有很强的物理合理性,并采用三种互补的验证方法对实验数据进行了调整。结果表明,垂直于样品表面的晶间应力在与晶粒平均尺寸相当的亚表面层中显著松弛。利用新型的x射线应力因子,确定了残余应力和无应变晶格参数的深度演化(深度可达45 μm)。
本文章由计算机程序翻译,如有差异,请以英文原文为准。

A novel approach for nondestructive depth-resolved analysis of residual stress and grain interaction in the near-surface zone applied to an austenitic stainless steel sample subjected to mechanical polishing

A novel approach for nondestructive depth-resolved analysis of residual stress and grain interaction in the near-surface zone applied to an austenitic stainless steel sample subjected to mechanical polishing

The choice of the grain interaction model is a critical element of residual stress analysis using diffraction methods. For the near-surface region of a mechanically polished austenitic steel, it is shown that the application of the widely used Eshelby-Kröner model does not lead to a satisfactory agreement with experimental observations. Therefore, a new grain interaction model called 'tunable free-surface' is proposed, allowing for the determination of the in-depth evolution of the elastic interaction between grains. It has a strong physical justification and is adjusted to experimental data using three complementary verification methods. It is shown that a significant relaxation of the intergranular stresses perpendicular to the sample surface occurs in the subsurface layer having a thickness comparable with the average size of the grain. Using the new type of X-ray Stress Factors, the in-depth evolution (up to the depth of 45 μm) of residual stresses and of the strain-free lattice parameter is determined.

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来源期刊
Measurement
Measurement 工程技术-工程:综合
CiteScore
10.20
自引率
12.50%
发文量
1589
审稿时长
12.1 months
期刊介绍: Contributions are invited on novel achievements in all fields of measurement and instrumentation science and technology. Authors are encouraged to submit novel material, whose ultimate goal is an advancement in the state of the art of: measurement and metrology fundamentals, sensors, measurement instruments, measurement and estimation techniques, measurement data processing and fusion algorithms, evaluation procedures and methodologies for plants and industrial processes, performance analysis of systems, processes and algorithms, mathematical models for measurement-oriented purposes, distributed measurement systems in a connected world.
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