利用相位噪声灵敏度分析时钟发生器的相位噪声

Yuanzhuo Liu;Yuandong Guo;Chaofeng Li;Siqi Bai;Bichen Chen;Srinivas Venkataraman;Xu Wang;Jun Fan;DongHyun Kim
{"title":"利用相位噪声灵敏度分析时钟发生器的相位噪声","authors":"Yuanzhuo Liu;Yuandong Guo;Chaofeng Li;Siqi Bai;Bichen Chen;Srinivas Venkataraman;Xu Wang;Jun Fan;DongHyun Kim","doi":"10.1109/TSIPI.2022.3222747","DOIUrl":null,"url":null,"abstract":"Phase noise represents signal instabilities in the frequency domain and is assessed through power measurements at various offsets from the carrier frequency. Herein, the phase noise of a clock generator is analyzed and modeled. Sources for the phase noise of the clock output at the resonance frequency are identified, including the power supply, the heatsink, and the external crystal. Low-frequency resonance is detected and validated to be caused by the external crystal grounding design. Solutions to decrease crystal-related noise are proposed and validated. In addition, the sensitivity based on the signal-to-noise ratio is proposed and verified with measurements to numerically analyze the effects of power supply noise on clock phase noise. The proposed phase noise sensitivity is extracted from the measured phase noise results and can be used to estimate the phase noise and jitter of different power supply noises. The extraction and prediction methods are validated with different buffer types, including low-voltage differential signal, high-speed current steering logic, low-voltage positive emitter-coupled logic, and low-voltage complementary metal–oxide–semiconductor, in a device under test with the given design.","PeriodicalId":100646,"journal":{"name":"IEEE Transactions on Signal and Power Integrity","volume":"1 ","pages":"150-159"},"PeriodicalIF":0.0000,"publicationDate":"2022-11-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Phase Noise Analysis of Clock Generator by Using Phase Noise Sensitivity\",\"authors\":\"Yuanzhuo Liu;Yuandong Guo;Chaofeng Li;Siqi Bai;Bichen Chen;Srinivas Venkataraman;Xu Wang;Jun Fan;DongHyun Kim\",\"doi\":\"10.1109/TSIPI.2022.3222747\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Phase noise represents signal instabilities in the frequency domain and is assessed through power measurements at various offsets from the carrier frequency. Herein, the phase noise of a clock generator is analyzed and modeled. Sources for the phase noise of the clock output at the resonance frequency are identified, including the power supply, the heatsink, and the external crystal. Low-frequency resonance is detected and validated to be caused by the external crystal grounding design. Solutions to decrease crystal-related noise are proposed and validated. In addition, the sensitivity based on the signal-to-noise ratio is proposed and verified with measurements to numerically analyze the effects of power supply noise on clock phase noise. The proposed phase noise sensitivity is extracted from the measured phase noise results and can be used to estimate the phase noise and jitter of different power supply noises. The extraction and prediction methods are validated with different buffer types, including low-voltage differential signal, high-speed current steering logic, low-voltage positive emitter-coupled logic, and low-voltage complementary metal–oxide–semiconductor, in a device under test with the given design.\",\"PeriodicalId\":100646,\"journal\":{\"name\":\"IEEE Transactions on Signal and Power Integrity\",\"volume\":\"1 \",\"pages\":\"150-159\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2022-11-16\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"IEEE Transactions on Signal and Power Integrity\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://ieeexplore.ieee.org/document/9953575/\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE Transactions on Signal and Power Integrity","FirstCategoryId":"1085","ListUrlMain":"https://ieeexplore.ieee.org/document/9953575/","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0

摘要

相位噪声表示频域中的信号不稳定性,并且通过与载波频率的各种偏移处的功率测量来评估相位噪声。本文对时钟发生器的相位噪声进行了分析和建模。识别了谐振频率下时钟输出的相位噪声源,包括电源、散热器和外部晶体。低频谐振被检测到,并被证实是由外部晶体接地设计引起的。提出并验证了降低晶体相关噪声的解决方案。此外,提出了基于信噪比的灵敏度,并通过测量进行了验证,以数值分析电源噪声对时钟相位噪声的影响。所提出的相位噪声灵敏度是从测量的相位噪声结果中提取的,可用于估计不同电源噪声的相位噪声和抖动。在给定设计的被测器件中,用不同的缓冲器类型验证了提取和预测方法,包括低电压差分信号、高速电流控制逻辑、低电压正射极耦合逻辑和低电压互补金属-氧化物-半导体。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Phase Noise Analysis of Clock Generator by Using Phase Noise Sensitivity
Phase noise represents signal instabilities in the frequency domain and is assessed through power measurements at various offsets from the carrier frequency. Herein, the phase noise of a clock generator is analyzed and modeled. Sources for the phase noise of the clock output at the resonance frequency are identified, including the power supply, the heatsink, and the external crystal. Low-frequency resonance is detected and validated to be caused by the external crystal grounding design. Solutions to decrease crystal-related noise are proposed and validated. In addition, the sensitivity based on the signal-to-noise ratio is proposed and verified with measurements to numerically analyze the effects of power supply noise on clock phase noise. The proposed phase noise sensitivity is extracted from the measured phase noise results and can be used to estimate the phase noise and jitter of different power supply noises. The extraction and prediction methods are validated with different buffer types, including low-voltage differential signal, high-speed current steering logic, low-voltage positive emitter-coupled logic, and low-voltage complementary metal–oxide–semiconductor, in a device under test with the given design.
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