B. Kruseman, B. Tasic, C. Hora, J. Dohmen, H. Hashempour, M. V. Beurden, Y. Xing
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Defect Oriented Testing for Analog/Mixed-Signal Designs
In this contribution, the authors describe an application of Defect Oriented Testing (DOT) to commercial mixed-signal designs. A major challenge of DOT application to these designs is the enormous simulation time typically required. The authors address this major challenge with a new algorithm that provides a significant speed-up of over 100x, while at the same time reduces test time by 48% and improves fault coverage by 15%.
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