多电平信号接口实时测试方法及其对测试成本的影响

IEEE Design & Test of Computers Pub Date : 2012-07-26 DOI:10.1109/MDT.2012.2210382

M. Ishida, K. Ichiyama, Tasuku Fujibe, D. Watanabe, M. Kawabata

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引用次数: 0

摘要

提出了一种多电平信号接口的实时测试方法。它利用可以调制输出信号的电压和时序的多电平驱动器，以及基于动态阈值概念的多电平比较器。作者还考虑了该系统对测试成本的影响，并将该成本与传统的二元测试系统进行了比较。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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Real-Time Testing Method for Multilevel Signal Interfaces and Its Impact on Test Cost

This paper proposes a real-time testing method for multilevel signal interfaces. It utilizes multilevel drivers that can modulate both the voltage and timing of an output signal, and multilevel comparators based on a dynamic threshold concept. The authors also consider the impact on test cost of the proposed system and compares that cost with a conventional binary test system.

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来源期刊

IEEE Design & Test of Computers 工程技术-工程：电子与电气

自引率

0.00%

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审稿时长

>12 weeks