各向异性导电胶(ACA)接头的超薄挠性芯片(UTCOF)互连的可靠性和灵活性

Su-Tsai Lu, Wen-Hwa Chen
{"title":"各向异性导电胶(ACA)接头的超薄挠性芯片(UTCOF)互连的可靠性和灵活性","authors":"Su-Tsai Lu, Wen-Hwa Chen","doi":"10.1109/TADVP.2010.2052806","DOIUrl":null,"url":null,"abstract":"The need for flexible interconnects in advanced applications in consumer electronic products is increasing rapidly. The reliability and flexibility of ultra-thin chip-on-flex (UTCOF) interconnects formed using anisotropic conductive adhesive (ACA) are thus investigated. Two films of ACA materials, namely ACA-P and ACA-F, are assembled at different bonding temperatures to study the effect of temperature on the adhesion at the substrate-adhesive and adhesive-chip interfaces using differential scanning calorimetry (DSC) and a 90° peeling test. The contact resistance of a daisy chain with 188 input/output (I/O) is measured to examine the quality of bonding through dummy test samples with an 80-μm pitch. The reliability of the fabricated UTCOF interconnects bonded via selected ACA joints is evaluated by performing an 85°C/85% RH thermal humidity storage test (THST) for 1000 h, and their flexibility is evaluated in static bending and four-point bending tests. The interfaces between the ultra-thin silicon chip and the substrate of failed samples in the THST and four-point bending testing are then investigated by scanning electron microscopy (SEM), which is utilized to obtain cross-sectional images. Finite element analysis is also conducted to elucidate the failure mechanism of the UTCOF interconnects in the four-point bending test. The averaged maximum allowable deflections of the fabricated UTCOF interconnects with ACA-P and ACA-F materials are 26% and 168%, respectively, higher than those of the COF interconnects with a chip thickness of 670 μm. Moreover, the contact resistance remains stable, varying by less than 10%, in the static bending test with a bending radius of 30 mm. According to the results thus obtained, give the appropriate choice of an ACA material and the optimal curing conditions, the UTCOF interconnects with ACA joints reliably serve as flexible interconnects for use in consumer electronic products.","PeriodicalId":55015,"journal":{"name":"IEEE Transactions on Advanced Packaging","volume":"33 1","pages":"702-712"},"PeriodicalIF":0.0000,"publicationDate":"2010-07-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://sci-hub-pdf.com/10.1109/TADVP.2010.2052806","citationCount":"29","resultStr":"{\"title\":\"Reliability and Flexibility of Ultra-Thin Chip-on-Flex (UTCOF) Interconnects With Anisotropic Conductive Adhesive (ACA) Joints\",\"authors\":\"Su-Tsai Lu, Wen-Hwa Chen\",\"doi\":\"10.1109/TADVP.2010.2052806\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The need for flexible interconnects in advanced applications in consumer electronic products is increasing rapidly. The reliability and flexibility of ultra-thin chip-on-flex (UTCOF) interconnects formed using anisotropic conductive adhesive (ACA) are thus investigated. Two films of ACA materials, namely ACA-P and ACA-F, are assembled at different bonding temperatures to study the effect of temperature on the adhesion at the substrate-adhesive and adhesive-chip interfaces using differential scanning calorimetry (DSC) and a 90° peeling test. The contact resistance of a daisy chain with 188 input/output (I/O) is measured to examine the quality of bonding through dummy test samples with an 80-μm pitch. The reliability of the fabricated UTCOF interconnects bonded via selected ACA joints is evaluated by performing an 85°C/85% RH thermal humidity storage test (THST) for 1000 h, and their flexibility is evaluated in static bending and four-point bending tests. The interfaces between the ultra-thin silicon chip and the substrate of failed samples in the THST and four-point bending testing are then investigated by scanning electron microscopy (SEM), which is utilized to obtain cross-sectional images. Finite element analysis is also conducted to elucidate the failure mechanism of the UTCOF interconnects in the four-point bending test. The averaged maximum allowable deflections of the fabricated UTCOF interconnects with ACA-P and ACA-F materials are 26% and 168%, respectively, higher than those of the COF interconnects with a chip thickness of 670 μm. Moreover, the contact resistance remains stable, varying by less than 10%, in the static bending test with a bending radius of 30 mm. According to the results thus obtained, give the appropriate choice of an ACA material and the optimal curing conditions, the UTCOF interconnects with ACA joints reliably serve as flexible interconnects for use in consumer electronic products.\",\"PeriodicalId\":55015,\"journal\":{\"name\":\"IEEE Transactions on Advanced Packaging\",\"volume\":\"33 1\",\"pages\":\"702-712\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2010-07-26\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"https://sci-hub-pdf.com/10.1109/TADVP.2010.2052806\",\"citationCount\":\"29\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"IEEE Transactions on Advanced Packaging\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/TADVP.2010.2052806\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE Transactions on Advanced Packaging","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/TADVP.2010.2052806","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 29

摘要

在消费电子产品的先进应用中,对柔性互连的需求正在迅速增加。研究了采用各向异性导电胶粘剂(ACA)形成的超薄柔性片(UTCOF)互连的可靠性和柔性。采用差示扫描量热法(DSC)和90°剥离试验,在不同的键合温度下组装ACA材料的两种薄膜,即ACA- p和ACA- f,研究温度对基材-粘合剂界面和粘合剂-芯片界面粘附的影响。通过测量输入/输出(I/O)为188的雏菊链的接触电阻,通过80 μm间距的假测试样品检测粘接质量。通过85°C/85% RH 1000 h的热湿储存试验(THST)评估了通过选定ACA接头粘合的预制UTCOF互连的可靠性,并在静态弯曲和四点弯曲试验中评估了它们的灵活性。然后利用扫描电子显微镜(SEM)研究了THST和四点弯曲试验中失效样品的超薄硅片与衬底之间的界面,并获得了截面图像。通过有限元分析,阐明了UTCOF连接件在四点弯曲试验中的破坏机理。与芯片厚度为670 μm的COF互连相比,采用ACA-P和ACA-F材料制备的UTCOF互连的平均最大允许挠度分别高出26%和168%。在弯曲半径为30 mm的静态弯曲试验中,接触电阻保持稳定,变化小于10%。根据所得结果,在适当选择ACA材料和最佳固化条件下,具有ACA接头的UTCOF互连可以可靠地用作消费电子产品中的柔性互连。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Reliability and Flexibility of Ultra-Thin Chip-on-Flex (UTCOF) Interconnects With Anisotropic Conductive Adhesive (ACA) Joints
The need for flexible interconnects in advanced applications in consumer electronic products is increasing rapidly. The reliability and flexibility of ultra-thin chip-on-flex (UTCOF) interconnects formed using anisotropic conductive adhesive (ACA) are thus investigated. Two films of ACA materials, namely ACA-P and ACA-F, are assembled at different bonding temperatures to study the effect of temperature on the adhesion at the substrate-adhesive and adhesive-chip interfaces using differential scanning calorimetry (DSC) and a 90° peeling test. The contact resistance of a daisy chain with 188 input/output (I/O) is measured to examine the quality of bonding through dummy test samples with an 80-μm pitch. The reliability of the fabricated UTCOF interconnects bonded via selected ACA joints is evaluated by performing an 85°C/85% RH thermal humidity storage test (THST) for 1000 h, and their flexibility is evaluated in static bending and four-point bending tests. The interfaces between the ultra-thin silicon chip and the substrate of failed samples in the THST and four-point bending testing are then investigated by scanning electron microscopy (SEM), which is utilized to obtain cross-sectional images. Finite element analysis is also conducted to elucidate the failure mechanism of the UTCOF interconnects in the four-point bending test. The averaged maximum allowable deflections of the fabricated UTCOF interconnects with ACA-P and ACA-F materials are 26% and 168%, respectively, higher than those of the COF interconnects with a chip thickness of 670 μm. Moreover, the contact resistance remains stable, varying by less than 10%, in the static bending test with a bending radius of 30 mm. According to the results thus obtained, give the appropriate choice of an ACA material and the optimal curing conditions, the UTCOF interconnects with ACA joints reliably serve as flexible interconnects for use in consumer electronic products.
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来源期刊
IEEE Transactions on Advanced Packaging
IEEE Transactions on Advanced Packaging 工程技术-材料科学:综合
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