{"title":"面向三维逻辑电路设计的垂直无结纳米线场效应管电热建模","authors":"Sara Mannaa;Arnaud Poittevin;Cédric Marchand;Damien Deleruyelle;Bastien Deveautour;Alberto Bosio;Ian O’Connor;Chhandak Mukherjee;Yifan Wang;Houssem Rezgui;Marina Deng;Cristell Maneux;Jonas Müller;Sylvain Pelloquin;Konstantinos Moustakas;Guilhem Larrieu","doi":"10.1109/JXCDC.2023.3309502","DOIUrl":null,"url":null,"abstract":"This work presents new insights into 3-D logic circuit design with vertical junctionless nanowire FETs (VNWFET) accounting for underlying electrothermal phenomena. Aided by the understanding of the nanoscale heat transport in VNWFETs through multiphysics simulations, the SPICE-compatible compact model captures temperature and trapping effects principally through a shift of the device threshold voltage. Circuit-level simulations indicate a strong impact of temperature variation on functionality and figures of merits, such as energy-delay products. Subsequent guidelines for design considerations are discussed that are intended to provide feedback for technology improvements.","PeriodicalId":54149,"journal":{"name":"IEEE Journal on Exploratory Solid-State Computational Devices and Circuits","volume":"9 2","pages":"116-123"},"PeriodicalIF":2.0000,"publicationDate":"2023-08-28","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=10232986","citationCount":"0","resultStr":"{\"title\":\"3-D Logic Circuit Design-Oriented Electrothermal Modeling of Vertical Junctionless Nanowire FETs\",\"authors\":\"Sara Mannaa;Arnaud Poittevin;Cédric Marchand;Damien Deleruyelle;Bastien Deveautour;Alberto Bosio;Ian O’Connor;Chhandak Mukherjee;Yifan Wang;Houssem Rezgui;Marina Deng;Cristell Maneux;Jonas Müller;Sylvain Pelloquin;Konstantinos Moustakas;Guilhem Larrieu\",\"doi\":\"10.1109/JXCDC.2023.3309502\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This work presents new insights into 3-D logic circuit design with vertical junctionless nanowire FETs (VNWFET) accounting for underlying electrothermal phenomena. Aided by the understanding of the nanoscale heat transport in VNWFETs through multiphysics simulations, the SPICE-compatible compact model captures temperature and trapping effects principally through a shift of the device threshold voltage. Circuit-level simulations indicate a strong impact of temperature variation on functionality and figures of merits, such as energy-delay products. Subsequent guidelines for design considerations are discussed that are intended to provide feedback for technology improvements.\",\"PeriodicalId\":54149,\"journal\":{\"name\":\"IEEE Journal on Exploratory Solid-State Computational Devices and Circuits\",\"volume\":\"9 2\",\"pages\":\"116-123\"},\"PeriodicalIF\":2.0000,\"publicationDate\":\"2023-08-28\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=10232986\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"IEEE Journal on Exploratory Solid-State Computational Devices and Circuits\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://ieeexplore.ieee.org/document/10232986/\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q3\",\"JCRName\":\"COMPUTER SCIENCE, HARDWARE & ARCHITECTURE\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE Journal on Exploratory Solid-State Computational Devices and Circuits","FirstCategoryId":"1085","ListUrlMain":"https://ieeexplore.ieee.org/document/10232986/","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q3","JCRName":"COMPUTER SCIENCE, HARDWARE & ARCHITECTURE","Score":null,"Total":0}
This work presents new insights into 3-D logic circuit design with vertical junctionless nanowire FETs (VNWFET) accounting for underlying electrothermal phenomena. Aided by the understanding of the nanoscale heat transport in VNWFETs through multiphysics simulations, the SPICE-compatible compact model captures temperature and trapping effects principally through a shift of the device threshold voltage. Circuit-level simulations indicate a strong impact of temperature variation on functionality and figures of merits, such as energy-delay products. Subsequent guidelines for design considerations are discussed that are intended to provide feedback for technology improvements.