Ag颗粒形状对TIM接头力学和热性能的影响

IF 0.7 4区 工程技术 Q4 ENGINEERING, ELECTRICAL & ELECTRONIC
M. Myśliwiec, R. Kisiel, M. Kruszewski
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引用次数: 0

摘要

目的开发和测试用于半导体芯片封装的热界面材料(TIM)。良好的粘接性能(bbb50mpa剪切强度)和低热界面阻力(优于SAC焊料)是本研究的目标。设计/方法/方法研究了芯片与衬底镀金触点之间的TIM接头的力学和热性能。本研究采用银糊烧结技术。通过剪切力测试和热测量来评估性能。采用扫描电镜对成形接头的横截面进行了显微组织观察。结果表明,含有几十微米大小的球形银颗粒和几微米大小的片状银颗粒的膏体具有最佳的性能。烧结温度为230℃,在烧结过程中施加1 MPa的力,晶片的附着力较高,热界面阻力最小。提出了一种基于银浆的新材料,该材料由不同尺寸(纳米至几十微米)和形状(球形、片状)的银颗粒混合而成,悬浮在树脂中。在230°C的压力下,用烧结技术和银糊制备的接头比其他TIM材料(如导热脂、导热凝胶或导热胶)具有更好的力学和热性能。这些材料可以使电子设备在200°C以上的温度下工作,这是目前基于硅的电力电子设备无法实现的。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Influence of Ag particle shape on mechanical and thermal properties of TIM joints
Purpose The purpose of this paper is to develop and test the thermal interface materials (TIM) for application in assembly of semiconductor chips to package. Good adhesion properties (>5 MPa shear strength) and low thermal interface resistance (better than for SAC solders) are the goal of this research. Design/methodology/approach Mechanical and thermal properties of TIM joints between gold plated contacts of chip and substrate were investigated. Sintering technique based on Ag pastes was applied for purpose of this study. Performance properties were assessed by shear force tests and thermal measurements. Scanning electron microscopy was used for microstructural observations of cross-section of formed joints. Findings It was concluded that the best properties are achieved for pastes containing spherical Ag particles of dozens of micrometer size with flake shaped Ag particles of few micrometers size. Sintering temperature at 230°C and application of 1 MPa force on the chip during sintering gave the higher adhesion and the lowest thermal interface resistance. Originality/value The new material based on Ag paste containing mixtures of Ag particles of different size (form nanometer to dozens of microns) and shape (spherical, flake) suspended in resin was proposed. Joints prepared using sintering technique and Ag pastes at 230°C with applied pressure shows better mechanical and thermal than other TIM materials such as thermal grease, thermal gel or thermally conductive adhesive. Those material could enable electronic device operation at temperatures above 200°C, currently unavailable for Si-based power electronics.
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来源期刊
Microelectronics International
Microelectronics International 工程技术-材料科学:综合
CiteScore
1.90
自引率
9.10%
发文量
28
审稿时长
>12 weeks
期刊介绍: Microelectronics International provides an authoritative, international and independent forum for the critical evaluation and dissemination of research and development, applications, processes and current practices relating to advanced packaging, micro-circuit engineering, interconnection, semiconductor technology and systems engineering. It represents a current, comprehensive and practical information tool. The Editor, Dr John Atkinson, welcomes contributions to the journal including technical papers, research papers, case studies and review papers for publication. Please view the Author Guidelines for further details. Microelectronics International comprises a multi-disciplinary study of the key technologies and related issues associated with the design, manufacture, assembly and various applications of miniaturized electronic devices and advanced packages. Among the broad range of topics covered are: • Advanced packaging • Ceramics • Chip attachment • Chip on board (COB) • Chip scale packaging • Flexible substrates • MEMS • Micro-circuit technology • Microelectronic materials • Multichip modules (MCMs) • Organic/polymer electronics • Printed electronics • Semiconductor technology • Solid state sensors • Thermal management • Thick/thin film technology • Wafer scale processing.
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