一种高鲁棒性和低功耗的触发器单元,具有完全的双节点破坏公差,用于航空航天应用

IF 1.9 4区 工程技术 Q3 COMPUTER SCIENCE, HARDWARE & ARCHITECTURE
Aibin Yan, Yuting He, Xiaoxiao Niu, Jie Cui, Tianming Ni, Zhengfeng Huang, P. Girard, X. Wen
{"title":"一种高鲁棒性和低功耗的触发器单元,具有完全的双节点破坏公差,用于航空航天应用","authors":"Aibin Yan, Yuting He, Xiaoxiao Niu, Jie Cui, Tianming Ni, Zhengfeng Huang, P. Girard, X. Wen","doi":"10.1109/MDAT.2023.3267747","DOIUrl":null,"url":null,"abstract":"This article proposes a robust and low power flip-flop cell with complete double-node-upset (DNU) tolerance for aerospace applications. The proposed cell is constructed from a master latch and a slave latch. The master latch comprises two C-elements as well as one clock-controlled C-element; the slave latch is similar to the master but has an extra keeper to avoid high-impedance state of the output-level C-element. The proposed cell can provide complete DNU-tolerance while reducing power dissipation by 65x0025; on average when compared with existing radiation-hardened flip-flop cells.","PeriodicalId":48917,"journal":{"name":"IEEE Design & Test","volume":null,"pages":null},"PeriodicalIF":1.9000,"publicationDate":"2023-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"A Highly Robust and Low-Power Flip-Flop Cell With Complete Double-Node-Upset Tolerance for Aerospace Applications\",\"authors\":\"Aibin Yan, Yuting He, Xiaoxiao Niu, Jie Cui, Tianming Ni, Zhengfeng Huang, P. Girard, X. Wen\",\"doi\":\"10.1109/MDAT.2023.3267747\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This article proposes a robust and low power flip-flop cell with complete double-node-upset (DNU) tolerance for aerospace applications. The proposed cell is constructed from a master latch and a slave latch. The master latch comprises two C-elements as well as one clock-controlled C-element; the slave latch is similar to the master but has an extra keeper to avoid high-impedance state of the output-level C-element. The proposed cell can provide complete DNU-tolerance while reducing power dissipation by 65x0025; on average when compared with existing radiation-hardened flip-flop cells.\",\"PeriodicalId\":48917,\"journal\":{\"name\":\"IEEE Design & Test\",\"volume\":null,\"pages\":null},\"PeriodicalIF\":1.9000,\"publicationDate\":\"2023-08-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"IEEE Design & Test\",\"FirstCategoryId\":\"5\",\"ListUrlMain\":\"https://doi.org/10.1109/MDAT.2023.3267747\",\"RegionNum\":4,\"RegionCategory\":\"工程技术\",\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q3\",\"JCRName\":\"COMPUTER SCIENCE, HARDWARE & ARCHITECTURE\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE Design & Test","FirstCategoryId":"5","ListUrlMain":"https://doi.org/10.1109/MDAT.2023.3267747","RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q3","JCRName":"COMPUTER SCIENCE, HARDWARE & ARCHITECTURE","Score":null,"Total":0}
引用次数: 0

摘要

本文提出了一种适用于航空航天应用的具有完全双节点镦粗(DNU)容限的鲁棒低功耗触发器单元。所提出的单元由主锁存器和从锁存器构成。主锁存器包括两个C元件以及一个时钟控制的C元件;从锁存器类似于主锁存器,但是具有额外的保持器以避免输出电平C元件的高阻抗状态。所提出的电池可以提供完全的DNU容限,同时将功耗降低65x0025;当与现有的辐射硬化的触发器单元相比时,平均而言。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
A Highly Robust and Low-Power Flip-Flop Cell With Complete Double-Node-Upset Tolerance for Aerospace Applications
This article proposes a robust and low power flip-flop cell with complete double-node-upset (DNU) tolerance for aerospace applications. The proposed cell is constructed from a master latch and a slave latch. The master latch comprises two C-elements as well as one clock-controlled C-element; the slave latch is similar to the master but has an extra keeper to avoid high-impedance state of the output-level C-element. The proposed cell can provide complete DNU-tolerance while reducing power dissipation by 65x0025; on average when compared with existing radiation-hardened flip-flop cells.
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来源期刊
IEEE Design & Test
IEEE Design & Test COMPUTER SCIENCE, HARDWARE & ARCHITECTURE-ENGINEERING, ELECTRICAL & ELECTRONIC
CiteScore
3.80
自引率
5.00%
发文量
98
期刊介绍: IEEE Design & Test offers original works describing the models, methods, and tools used to design and test microelectronic systems from devices and circuits to complete systems-on-chip and embedded software. The magazine focuses on current and near-future practice, and includes tutorials, how-to articles, and real-world case studies. The magazine seeks to bring to its readers not only important technology advances but also technology leaders, their perspectives through its columns, interviews, and roundtable discussions. Topics include semiconductor IC design, semiconductor intellectual property blocks, design, verification and test technology, design for manufacturing and yield, embedded software and systems, low-power and energy-efficient design, electronic design automation tools, practical technology, and standards.
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