利用SPring-8光电子显微镜的研究现状及最新进展

IF 1.8 4区物理与天体物理 Q2 SPECTROSCOPY

Journal of Electron Spectroscopy and Related Phenomena Pub Date : 2023-08-01 DOI:10.1016/j.elspec.2023.147371

T. Ohkochi , M. Tanaka , T. Ohtsuki , Z. Horita , F. Kitajima , A. Yamaguchi , M. Kotsugi , H. Ogawa , M. Oura

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引用次数: 0

摘要

光电电子显微镜(PEEM)，特别是当与同步辐射相结合时，在光谱学应用中具有强大的功能。PEEM的使用稳步扩大了SPring-8同步加速器设施的可用分析对象，如磁性材料、薄膜器件、半导体、单层、地外物质和多铁质。还根据用户要求开发了一些特殊的实验设置，如时间分辨或operando测量。在本文中，我们概述了迄今为止PEEM的研究成果，并介绍了SPring-8的一些最新技术和科学进展。

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Present status and recent progress of research, using photoemission-electron microscopy at SPring-8

Photoemission electron microscopy (PEEM), particularly when combined with synchrotron radiation, exerts a powerful functionality in spectroscopy applications. The use of PEEM has steadily expanded the availed analysis objects at the SPring-8 synchrotron facility, such as magnetic materials, thin-film devices, semiconductors, monolayers, extraterrestrial matter, and multiferroics. Some special experimental settings such as time-resolved or operando measurements have also been developed according to user requests. In this paper, we present an overview on the achievements of PEEM studies so far and introduce some recent technical and scientific progress at SPring-8.

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来源期刊

Journal of Electron Spectroscopy and Related Phenomena 物理-光谱学

CiteScore

3.30

自引率

5.30%

发文量

审稿时长

60 days

期刊介绍： The Journal of Electron Spectroscopy and Related Phenomena publishes experimental, theoretical and applied work in the field of electron spectroscopy and electronic structure, involving techniques which use high energy photons (>10 eV) or electrons as probes or detected particles in the investigation.