使用平面偏移的自由空间二层一端口校准(简称材料测量)

IF 1.6 3区 工程技术 Q3 ENGINEERING, ELECTRICAL & ELECTRONIC
Jin-Seob Kang
{"title":"使用平面偏移的自由空间二层一端口校准(简称材料测量)","authors":"Jin-Seob Kang","doi":"10.26866/jees.2022.6.r.135","DOIUrl":null,"url":null,"abstract":"The scattering parameters of a material under test (MUT) are prerequisites for characterizing the material parameters of the MUT. This paper describes a free-space two-tier one-port calibration method using a planar offset short as a free-space calculable reflect standard for measuring the scattering parameters of an MUT from the two successive one-port calibrations of a free-space material measurement system without a precise positioning system in free space. The two-tier one-port calibration method is validated by comparing the measurement results with those of the thru-reflect-line (TRL) calibration method for two reciprocal MUTs (glass plates of 2.780 mm and 4.775 mm thickness) in the W-band (75–110 GHz). Good agreement between the measurement results from the two calibration methods demonstrates that the free-space two-tier one-port calibration method using a planar offset short can be a feasible and effective alternative to the conventional free-space two-port calibration methods.","PeriodicalId":15662,"journal":{"name":"Journal of electromagnetic engineering and science","volume":null,"pages":null},"PeriodicalIF":1.6000,"publicationDate":"2022-11-30","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Free-Space Two-Tier One-Port Calibration Using a Planar Offset Short for Material Measurement\",\"authors\":\"Jin-Seob Kang\",\"doi\":\"10.26866/jees.2022.6.r.135\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The scattering parameters of a material under test (MUT) are prerequisites for characterizing the material parameters of the MUT. This paper describes a free-space two-tier one-port calibration method using a planar offset short as a free-space calculable reflect standard for measuring the scattering parameters of an MUT from the two successive one-port calibrations of a free-space material measurement system without a precise positioning system in free space. The two-tier one-port calibration method is validated by comparing the measurement results with those of the thru-reflect-line (TRL) calibration method for two reciprocal MUTs (glass plates of 2.780 mm and 4.775 mm thickness) in the W-band (75–110 GHz). Good agreement between the measurement results from the two calibration methods demonstrates that the free-space two-tier one-port calibration method using a planar offset short can be a feasible and effective alternative to the conventional free-space two-port calibration methods.\",\"PeriodicalId\":15662,\"journal\":{\"name\":\"Journal of electromagnetic engineering and science\",\"volume\":null,\"pages\":null},\"PeriodicalIF\":1.6000,\"publicationDate\":\"2022-11-30\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Journal of electromagnetic engineering and science\",\"FirstCategoryId\":\"5\",\"ListUrlMain\":\"https://doi.org/10.26866/jees.2022.6.r.135\",\"RegionNum\":3,\"RegionCategory\":\"工程技术\",\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q3\",\"JCRName\":\"ENGINEERING, ELECTRICAL & ELECTRONIC\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Journal of electromagnetic engineering and science","FirstCategoryId":"5","ListUrlMain":"https://doi.org/10.26866/jees.2022.6.r.135","RegionNum":3,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q3","JCRName":"ENGINEERING, ELECTRICAL & ELECTRONIC","Score":null,"Total":0}
引用次数: 0

摘要

被测材料(MUT)的散射参数是表征MUT的材料参数的先决条件。本文描述了一种使用平面偏移短作为自由空间可计算反射标准的自由空间双层单端口校准方法,用于从自由空间中没有精确定位系统的自由空间材料测量系统的两个连续单端口校准中测量MUT的散射参数。通过将测量结果与W波段(75–110 GHz)中两个相互MUT(2.780 mm和4.775 mm厚的玻璃板)的透反射线(TRL)校准方法的测量结果进行比较,验证了双层一端口校准方法。两种校准方法的测量结果之间的良好一致性表明,使用平面偏置短路的自由空间两层一端口校准方法是传统自由空间两端口校准方法的可行和有效的替代方案。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Free-Space Two-Tier One-Port Calibration Using a Planar Offset Short for Material Measurement
The scattering parameters of a material under test (MUT) are prerequisites for characterizing the material parameters of the MUT. This paper describes a free-space two-tier one-port calibration method using a planar offset short as a free-space calculable reflect standard for measuring the scattering parameters of an MUT from the two successive one-port calibrations of a free-space material measurement system without a precise positioning system in free space. The two-tier one-port calibration method is validated by comparing the measurement results with those of the thru-reflect-line (TRL) calibration method for two reciprocal MUTs (glass plates of 2.780 mm and 4.775 mm thickness) in the W-band (75–110 GHz). Good agreement between the measurement results from the two calibration methods demonstrates that the free-space two-tier one-port calibration method using a planar offset short can be a feasible and effective alternative to the conventional free-space two-port calibration methods.
求助全文
通过发布文献求助,成功后即可免费获取论文全文。 去求助
来源期刊
Journal of electromagnetic engineering and science
Journal of electromagnetic engineering and science ENGINEERING, ELECTRICAL & ELECTRONIC-
CiteScore
2.90
自引率
17.40%
发文量
82
审稿时长
10 weeks
期刊介绍: The Journal of Electromagnetic Engineering and Science (JEES) is an official English-language journal of the Korean Institute of Electromagnetic and Science (KIEES). This journal was launched in 2001 and has been published quarterly since 2003. It is currently registered with the National Research Foundation of Korea and also indexed in Scopus, CrossRef and EBSCO, DOI/Crossref, Google Scholar and Web of Science Core Collection as Emerging Sources Citation Index(ESCI) Journal. The objective of JEES is to publish academic as well as industrial research results and discoveries in electromagnetic engineering and science. The particular scope of the journal includes electromagnetic field theory and its applications: High frequency components, circuits, and systems, Antennas, smart phones, and radars, Electromagnetic wave environments, Relevant industrial developments.
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术官方微信