使用平面偏移的自由空间二层一端口校准（简称材料测量）

IF 1.6 3区工程技术 Q3 ENGINEERING, ELECTRICAL & ELECTRONIC

Journal of electromagnetic engineering and science Pub Date : 2022-11-30 DOI:10.26866/jees.2022.6.r.135

Jin-Seob Kang

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引用次数: 0

摘要

被测材料（MUT）的散射参数是表征MUT的材料参数的先决条件。本文描述了一种使用平面偏移短作为自由空间可计算反射标准的自由空间双层单端口校准方法，用于从自由空间中没有精确定位系统的自由空间材料测量系统的两个连续单端口校准中测量MUT的散射参数。通过将测量结果与W波段（75–110 GHz）中两个相互MUT（2.780 mm和4.775 mm厚的玻璃板）的透反射线（TRL）校准方法的测量结果进行比较，验证了双层一端口校准方法。两种校准方法的测量结果之间的良好一致性表明，使用平面偏置短路的自由空间两层一端口校准方法是传统自由空间两端口校准方法的可行和有效的替代方案。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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Free-Space Two-Tier One-Port Calibration Using a Planar Offset Short for Material Measurement

The scattering parameters of a material under test (MUT) are prerequisites for characterizing the material parameters of the MUT. This paper describes a free-space two-tier one-port calibration method using a planar offset short as a free-space calculable reflect standard for measuring the scattering parameters of an MUT from the two successive one-port calibrations of a free-space material measurement system without a precise positioning system in free space. The two-tier one-port calibration method is validated by comparing the measurement results with those of the thru-reflect-line (TRL) calibration method for two reciprocal MUTs (glass plates of 2.780 mm and 4.775 mm thickness) in the W-band (75–110 GHz). Good agreement between the measurement results from the two calibration methods demonstrates that the free-space two-tier one-port calibration method using a planar offset short can be a feasible and effective alternative to the conventional free-space two-port calibration methods.

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来源期刊

Journal of electromagnetic engineering and science ENGINEERING, ELECTRICAL & ELECTRONIC-

CiteScore

2.90

自引率

17.40%

发文量

审稿时长

10 weeks

期刊介绍： The Journal of Electromagnetic Engineering and Science (JEES) is an official English-language journal of the Korean Institute of Electromagnetic and Science (KIEES). This journal was launched in 2001 and has been published quarterly since 2003. It is currently registered with the National Research Foundation of Korea and also indexed in Scopus, CrossRef and EBSCO, DOI/Crossref, Google Scholar and Web of Science Core Collection as Emerging Sources Citation Index(ESCI) Journal. The objective of JEES is to publish academic as well as industrial research results and discoveries in electromagnetic engineering and science. The particular scope of the journal includes electromagnetic field theory and its applications: High frequency components, circuits, and systems, Antennas, smart phones, and radars, Electromagnetic wave environments, Relevant industrial developments.