光谱STXM中的数据分析

IF 1.8 4区物理与天体物理 Q2 SPECTROSCOPY

Journal of Electron Spectroscopy and Related Phenomena Pub Date : 2023-04-01 DOI:10.1016/j.elspec.2023.147310

Matthew A. Marcus

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引用次数: 2

摘要

STXM(扫描透射x射线(光谱)显微镜)测量的典型输出是一个数据立方体，由一组在入射能量序列下拍摄的图像(像素网格上x射线透射的测量)组成。与任何实验测量一样，必须将这些原始数据简化为某种标准形式并进行解释。在本文中，我回顾了如何从原始数据到样本信息的基础知识。我将讨论x射线光谱显微镜的基本原理，数据还原，描述性和基于模型的分析，以及可用的软件，并从文献中取了例子。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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Data analysis in spectroscopic STXM

The typical output of a STXM (Scanning Transmission X-ray (spectro)Microscopy) measurement is a data cube consisting of a set of images (measurements of X-ray transmission at a grid of pixels) taken at a sequence of incident energies. As with any experimental measurement, this raw data must be reduced to some standard form and interpreted. In this paper, I review the basics of how to go from raw data to information about the sample. I will discuss the fundamentals of X-ray spectromicroscopy, data reduction, descriptive and model-based analysis, and available software, with examples taken from the literature.

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来源期刊

Journal of Electron Spectroscopy and Related Phenomena 物理-光谱学

CiteScore

3.30

自引率

5.30%

发文量

审稿时长

60 days

期刊介绍： The Journal of Electron Spectroscopy and Related Phenomena publishes experimental, theoretical and applied work in the field of electron spectroscopy and electronic structure, involving techniques which use high energy photons (>10 eV) or electrons as probes or detected particles in the investigation.