用衍射束干涉法对位错进行相位成像

IF 1.8 4区工程技术

Microscopy Pub Date : 2021-06-01 DOI:10.1093/jmicro/dfaa066

Rodney Herring

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引用次数: 3

摘要

描述了一种测量位错核处存在的相移的相位成像方法。该方法利用两个对称衍射光束在光轴上的电子双棱镜干涉。每个衍射光束携带位错核心的一半相位。当组合时，可以获得位错核心的整个相移。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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Phase imaging dislocations using diffracted beam interferometry

A phase imaging method that measures the phase shift existing at a dislocation's core is described. The method uses the interference of two symmetrically diffracted beams on the optic axis by means of an electron biprism. Each diffracted beam carries half the phase of the dislocation core. When combined, the entire phase shift of the dislocation core is obtained.

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来源期刊

Microscopy 工程技术-显微镜技术

自引率

11.10%

发文量

审稿时长

>12 weeks

期刊介绍： Microscopy, previously Journal of Electron Microscopy, promotes research combined with any type of microscopy techniques, applied in life and material sciences. Microscopy is the official journal of the Japanese Society of Microscopy.