小角度电子衍射和洛伦兹显微术的最新进展

IF 1.8 4区工程技术

Microscopy Pub Date : 2020-11-01 DOI:10.1093/jmicro/dfaa048

Shigeo Mori;Hiroshi Nakajima;Atsuhiro Kotani;Ken Harada

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引用次数: 2

摘要

我们描述了使用传统透射电子显微镜的小角度电子衍射（SmAED）和洛伦兹显微镜。在SmAED中，具有1量级的宽角度范围的电子衍射图案 × 10−2 rad至1 × 可以获得10−7 rad。结果表明，利用菲涅耳成像、福柯成像和SmAED可以获得纳米磁性微结构的磁信息。特别是，我们报道了通过SmAED的洛伦兹显微镜揭示的与磁条和磁性skyrmions相关的磁性微观结构。SmAED可应用于功能材料（如电介质、铁磁材料和多铁性材料）的微观结构分析。

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Recent advances in small-angle electron diffraction and Lorentz microscopy

We describe small-angle electron diffraction (SmAED) and Lorentz microscopy using a conventional transmission electron microscope. In SmAED, electron diffraction patterns with a wide-angular range on the order of 1 × 10 ⁻² rad to 1 × 10 ⁻⁷ rad can be obtained. It is demonstrated that magnetic information of nanoscale magnetic microstructures can be obtained by Fresnel imaging, Foucault imaging and SmAED. In particular, we report magnetic microstructures associated with magnetic stripes and magnetic skyrmions revealed by Lorentz microscopy with SmAED. SmAED can be applied to the analysis of microstructures in functional materials such as dielectric, ferromagnetic and multiferroic materials.

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来源期刊

Microscopy 工程技术-显微镜技术

自引率

11.10%

发文量

审稿时长

>12 weeks

期刊介绍： Microscopy, previously Journal of Electron Microscopy, promotes research combined with any type of microscopy techniques, applied in life and material sciences. Microscopy is the official journal of the Japanese Society of Microscopy.