将CIPM和RMO关键比较结果与线性趋势联系起来。

IF 1.5 4区工程技术

Journal of Research of the National Institute of Standards and Technology Pub Date : 2010-06-01 Print Date: 2010-05-01 DOI:10.6028/jres.115.010

Nien Fan Zhang

{"title":"将CIPM和RMO关键比较结果与线性趋势联系起来。","authors":"Nien Fan Zhang","doi":"10.6028/jres.115.010","DOIUrl":null,"url":null,"abstract":"A statistical approach to link the results of interlaboratory comparisons with linear trends is proposed. This approach can be applied to the case that the comparison artifacts have the same nominal values or the measured quantities have the same magnitudes. The degrees of equivalence between the pairs of National Metrology Institutes that have not participated in the same comparisons, and their corresponding uncertainties are established. The approach is applied to link the CCEM-K2 and SIM.EM-K2 comparisons for resistance at 1 G Ω level.","PeriodicalId":17039,"journal":{"name":"Journal of Research of the National Institute of Standards and Technology","volume":"115 3","pages":"179-94"},"PeriodicalIF":1.5000,"publicationDate":"2010-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4548531/pdf/","citationCount":"2","resultStr":"{\"title\":\"Linking the Results of CIPM and RMO Key Comparisons With Linear Trends.\",\"authors\":\"Nien Fan Zhang\",\"doi\":\"10.6028/jres.115.010\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"A statistical approach to link the results of interlaboratory comparisons with linear trends is proposed. This approach can be applied to the case that the comparison artifacts have the same nominal values or the measured quantities have the same magnitudes. The degrees of equivalence between the pairs of National Metrology Institutes that have not participated in the same comparisons, and their corresponding uncertainties are established. The approach is applied to link the CCEM-K2 and SIM.EM-K2 comparisons for resistance at 1 G Ω level.\",\"PeriodicalId\":17039,\"journal\":{\"name\":\"Journal of Research of the National Institute of Standards and Technology\",\"volume\":\"115 3\",\"pages\":\"179-94\"},\"PeriodicalIF\":1.5000,\"publicationDate\":\"2010-06-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4548531/pdf/\",\"citationCount\":\"2\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Journal of Research of the National Institute of Standards and Technology\",\"FirstCategoryId\":\"5\",\"ListUrlMain\":\"https://doi.org/10.6028/jres.115.010\",\"RegionNum\":4,\"RegionCategory\":\"工程技术\",\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"2010/5/1 0:00:00\",\"PubModel\":\"Print\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Journal of Research of the National Institute of Standards and Technology","FirstCategoryId":"5","ListUrlMain":"https://doi.org/10.6028/jres.115.010","RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"2010/5/1 0:00:00","PubModel":"Print","JCR":"","JCRName":"","Score":null,"Total":0}

引用次数: 2

摘要

提出了一种将实验室间比较结果与线性趋势联系起来的统计方法。这种方法可以应用于比较工件具有相同标称值或测量量具有相同幅度的情况。建立了未参与同一比较的国家计量院对之间的等值度及其相应的不确定度。将该方法应用于CCEM-K2与SIM的连接。EM-K2在1g Ω水平下的电阻比较。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

Linking the Results of CIPM and RMO Key Comparisons With Linear Trends.

查看原文本刊更多论文

Linking the Results of CIPM and RMO Key Comparisons With Linear Trends.

A statistical approach to link the results of interlaboratory comparisons with linear trends is proposed. This approach can be applied to the case that the comparison artifacts have the same nominal values or the measured quantities have the same magnitudes. The degrees of equivalence between the pairs of National Metrology Institutes that have not participated in the same comparisons, and their corresponding uncertainties are established. The approach is applied to link the CCEM-K2 and SIM.EM-K2 comparisons for resistance at 1 G Ω level.

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来源期刊

Journal of Research of the National Institute of Standards and Technology Engineering-General Engineering

自引率

33.30%

发文量

期刊介绍： The Journal of Research of the National Institute of Standards and Technology is the flagship publication of the National Institute of Standards and Technology. It has been published under various titles and forms since 1904, with its roots as Scientific Papers issued as the Bulletin of the Bureau of Standards. In 1928, the Scientific Papers were combined with Technologic Papers, which reported results of investigations of material and methods of testing. This new publication was titled the Bureau of Standards Journal of Research. The Journal of Research of NIST reports NIST research and development in metrology and related fields of physical science, engineering, applied mathematics, statistics, biotechnology, information technology.