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引用次数: 0
摘要
In II 光谱中最佳测量波长的综合清单已经编制完成。分析了波长测量的不确定性,并解决了现有的不一致问题。得出了一套适合所有观测波长的优化精细结构能级。能级值的不确定性降低了一个数量级。通过拟合多个系列能级的量子缺陷和极化公式,确定了 In II 电离极限的改进值。对不同作者观测到的线强度进行了分析,并将其转换为统一尺度。对一组辐射转化率的推荐值进行了严格的汇编,并对这些转化率的不确定性进行了估计。根据对 In II 中 5sng 和 5snh 系列的测量结果,确定了 In III 中 5s (2)S 基态的超细结构间隔。
Critically Evaluated Energy Levels and Spectral Lines of Singly Ionized Indium (In II).
A comprehensive list of the best measured wavelengths in the In II spectrum has been compiled. Uncertainties of the wavelength measurements have been analyzed, and existing inconsistencies have been resolved. An optimized set of fine-structure energy levels that fits all observed wavelengths has been derived. Uncertainties of the energy level values have been reduced by an order of magnitude. An improved value of the ionization limit of In II has been determined by fitting quantum-defect and polarization formulas for several series of levels. Intensities of lines observed by different authors have been analyzed and converted to a uniform scale. A set of recommended values of radiative transition rates has been critically compiled, and uncertainties of these rates have been estimated. The hyperfine structure interval in the 5s (2)S ground state of In III has been determined from the measurements of the 5sng and 5snh series in In II.
期刊介绍:
The Journal of Research of the National Institute of Standards and Technology is the flagship publication of the National Institute of Standards and Technology. It has been published under various titles and forms since 1904, with its roots as Scientific Papers issued as the Bulletin of the Bureau of Standards.
In 1928, the Scientific Papers were combined with Technologic Papers, which reported results of investigations of material and methods of testing. This new publication was titled the Bureau of Standards Journal of Research.
The Journal of Research of NIST reports NIST research and development in metrology and related fields of physical science, engineering, applied mathematics, statistics, biotechnology, information technology.